Device for measuring mechanical states of stress in components

A device for measuring mechanical states of stress in a component, comprising:

• a part of said device being non-positively joined to said component whose mechanical states of stress are to be measured, said part undergoing a change in a measurable variable in the event of a change in the mechanical states of stress;
• wherein said part of the device is a layer deposited on the component by atomic growth, said layer having a layer structure consisting of less than 8% by weight of phosphorous, up to 2% by weight of an element from one of main groups IV and V, of the Periodic System of Elements, and up to 5% by weight of a transition metal element, a remaining sum of said percentages by weight being increased to 100% with nickel;
• a coil arrangement comprising two coils wherein said layer changes its magnetic permeability when the mechanical states of stress are applied and influences a magnetic flux in said coil arrangement, said modification of the magnetic flux is evaluated and the mechanical states of stress of the component are deduced from the changes in the magnetic flux;
• and
• wherein the layer is deposited on the component in a helically extending strip, said strip having a strip completely surrounding the component at its upper and lower termination in each case, each of these two strips being coaxially surrounded by one of said coils of the coil arrangement, said two coils being transformer-coupled and the mechanical state of stress of the component being deduced from the output signal of the secondary coil, and in that the top, bottom and outside surface of the coils and the joint of the outside surfaces of the coils are surrounded by components composed of a soft-magnetic material which has low magnetostriction.