Fram aligner with reduced circuit scale
AssigneeOki Electric Industry Co., Ltd.
InventorKuniichi Ikemura
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AssigneeOki Electric Industry Co., Ltd.
InventorKuniichi Ikemura
Estimating the term…
A frame aligner detects sync patterns consisting of at least two units of data having a first value followed by at least two units of data having a second value in a serial data signal. The serial signal is demultiplexed to units of parallel data, which are stored in a shift register having a capacity of two units of data. All but one bit off the stored data are scanned to detect a unit having the first value. When such a unit is detected, alignment data indicating its position in the shift register are generated. The alignment data are latched and used to extract subsequent units from the shift register. New and old alignment data are compared to detect aligned units having the first value. A sync pattern is recognized as a consecutive sequence of such aligned units followed by a consecutive sequence of units having the second value.
A method of searching for and checking sync patterns in frames of serial data that have been demultiplexed to units of a certain number of bits of parallel input data, comprising the steps of:
The method of claim 9 wherein, if said enable signal is reasserted at an anticipated sync pattern position in said step (j), and if a unit of data having said first value is then found in said step (b) but its alignment data do not match the alignment data latched in said step (c), said in-frame signal is negated and said step (i) begins again.
An alignment circuit for aligning frames of serial data that have been demultiplexed to units of a certain number of bits of parallel input data, comprising:
Dependencies are inferred from the claim text.