Semiconductor memory device with changeable input/output data bit arrangement
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsTakahiko Fukiage, Yoshinori Inoue
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AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsTakahiko Fukiage, Yoshinori Inoue
Estimating the term…
A dynamic type semiconductor memory device includes a plurality of data input/output nodes, a plurality of /CAS buffers for generating column address strobe signals corresponding to each of said input/output nodes, and an input node carrying out only data input. A switching signal generation circuit generates first and second switching signals indicating data input/output control modes. Memory cells corresponding in number to the data input/output nodes are selected simultaneously from a memory cell array. In operation of control mode A, data input/output is effected using an input node and one data input/ouput node. In the case of control mode B, data writing/reading is effected via a plurality of data input/output nodes according to one column address strobe signal. In the case of control mode C, data input/output is carried out individually for each input/output node according to a plurality of column address strobe signals. Modes A, B and C can be realized in one DRAM. Particularly, in mode C controlling data input/output according to respective column address strobe signals, writing/reading of unnecessary data bits can be prevented to reduce power consumption and prevent erroneous parity bit writing.
A semiconductor memory device comprising:
A method of driving a semiconductor memory device including a memory cell array having a plurality of memory cells and a plurality of data input nodes, said method comprising the steps of:
A method of driving a semiconductor memory device including a memory cell array having a plurality of memory cells and a plurality of data output nodes, said method comprising the steps of:
Dependencies are inferred from the claim text.