Apparatus and method for specifying the flow of test execution and the binning for a testing system
AssigneeHewlett-Packard Company
InventorsJohn G. Rohrbaugh, Thomas H. Baker, Michael J. Bennett, Mercedes E. Gil, Robert W. Proulx
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Abstract
The present invention is a method for specifying test flow and binning of an integrated circuit part in an integrated circuit tester. The method comprises the steps of receiving descriptions of the tests, receiving test flow statements indicating when the tests are to be executed, receiving binning statements, executing the tests as indicated by the test flow statements, and binning the IC device as indicated by the results of the tests.
Claims52
A method for testing a device, comprising the steps of:
- (a) inputting configuration data including one or more statements of a testflow-specific language;
- (b) generating, from said configuration data, a testflow structure including a flownode representative of each said statement;
- (c) selecting an initial flownode of said testflow structure;
- (d) executing said selected flownode, wherein, if said selected flownode represents a run statement, said executing includes the steps of:
- (i) executing a test indicated by said run statement on the device, and
- (ii) storing at least one test result from said test;
- (e) if there is a subsequent flownode in said testflow structure, then selecting said subsequent flownode and repeating step (d) as required;
- and
- (f) binning the device wherein said binning is independent of said testflow structure, the step of binning comprising the steps of:
- (i) inputting a binning specification,
- (ii) generating a binning set comprising at least one binning rule,
- (iii) inputting said at least:
- one stored test result, and
- (iv) binning the device based on said binning rules and said at least one stored test result.
A computer-based apparatus for testing a device, comprising:
- a parser which receives configuration data having a statement of a testflow-specific language and generates a testflow structure, having at least one flownode;
- traversing means for traversing said testflow structure by invoking means for processing flownodes in said testflow structure;
- means for processing a run flownode including:
- means for executing a test of said run flownode on the device;
- and
- means for storing at least one test result of said test;
- and
- means for binning the device, wherein said binning is based on said at least one stored test result, and said binning is independent of said test-flow structure.
A method for characterizing a device, comprising the steps of:
- (a) inputting a binning specification;
- (b) generating, from said binning specification, a binning set comprising at least one binning rule;
- (c) inputting at least one stored test result for the device;
- (d) selecting an initial binning rule from said binning set;
- (e) determining whether an expression of said selected binning rule is true based on said at least one stored test result;
- (f) if said expression is false and if there is a next binning rule in said binning set, then selecting said next binning;
- rule and repeating step (e);
- and
- (g) communicating, to a user, a bin associated with said selected rule.
An computer-based apparatus for characterizing a device, comprising:
- means for receiving from a tester, at least one stored test result of a test executed on the device;
- a parser which receives a binning specification and generates a binning structure comprising at least one binning rule, wherein said binning rule comprises a bin for characterizing the device and an expression;
- evaluating means for determining whether said expression is true based on said at least one stored test result;
- traversing means for invoking said evaluating means on each binning rule in said binning structure until reaching an applicable rule for which said evaluating means determines said expression to be true;
- and
- means for indicating said bin of said applicable binning rule to a user.
Dependencies are inferred from the claim text.