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AssigneeMarconi Instruments Limited
InventorsMark A. Laing, Robert J. Williams
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A method of testing the electrical conductivity of a connection between an integrated circuit device (9) and a circuit board (7) to which the device (9) is connected. The device (9) includes a current path between a further connection (13) thereto and the connection (15) to be tested. The method comprises the steps of, while the circuit is inoperative: applying via the board (8) a potential of a first amount to the further connection (13); applying via the board (7) a potential of a second different amount to the connection (15) being tested; and positioning a probe adjacent the device (9) to sense indirectly current in the current path, the presence of current indicating that the connection (15) being tested is conductive.
A method of testing the electrical conductivity of a first connection between an integrated circuit device and a circuit board to which the device is connected, a second connection also connecting said device to said board, said device including therewithin a current path between said first and second connections, said method comprising the steps of, while the circuit is inoperative:
Dependencies are inferred from the claim text.