Arsenic passivation for epitaxial deposition of ternary chalcogenide semiconductor films onto silicon substrates
AssigneeHughes Aircraft Company
InventorTerence J. de Lyon
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Abstract
Ternary II-VI semiconductor films (16) are formed on a silicon substrate (12) by first depositing a monolayer of arsenic (14) or other Group V metal on a cleaned surface of the substrate. The ternary II-VI semiconductor film is then formed over the arsenic monolayer, either directly thereon or on top of an intermediate II-VI semiconductor buffer layer (18). The use of an arsenic passivating layer facilitates the epitaxial deposition of technologically important II-VI semiconductors such as ZnTe, CdTe, and HgCdTe on silicon substrates of arbitrary crystallographic orientation.
Claims13
A multilayer stack for fabrication of II-VI devices thereon, comprising:
- (a) a silicon substrate;
- (b) a monolayer of a Group V element selected from the group consisting of arsenic, phosphorus, and antimony, formed on a surface of said silicon substrate;
- and
- (c) a II-VI epilayer other than ZnSe formed over said Group V monolayer.
The multilayer stack of claim I wherein said II-VI epilayer comprises a semiconductor compound selected from the group consisting of ZnTe, CdTe, CdSe, CdS, ZnS, HgCdTe, HgZnTe, HgCdSe, HgZnSe, HgCdS, HgZnS, ZnCdSeTe, ZnCdSSe, ZnCdSTe, HgCdZnTe, HgCdSeTe, and HgZnSeTe.
A multilayer stack for fabrication of II-VI devices thereon, comprising:
- (a) a silicon substrate;
- (b) a monolayer of arsenic, formed on a surface of said silicon substrate;
- and
- (c) a II-VI epilayer other than ZnSe formed over said arsenic monolayer.
Dependencies are inferred from the claim text.