Device for charging a measuring apparatus for thermal analysis with material specimens filled into containers
AssigneeMettler-Toledo AG
InventorKarl Lang
Life of this patent
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AssigneeMettler-Toledo AG
InventorKarl Lang
Estimating the term…
A device for charging a measuring apparatus for thermal analysis with material specimens filled into containers includes a vertically displaceable gripping member and a rotatable specimen plate with a plurality of openings arranged in a circle. For transferring a specimen container to the measuring location in the measuring apparatus, the specimen container is moved underneath the gripping member by rotating the specimen plate, the gripping member is lowered and the specimen container is gripped by gripping fingers attached to the gripping member. The container is then raised from the specimen plate by raising the gripping member. Subsequently, the specimen plate is rotated until a recess in the specimen plate is located underneath the gripping member. The measuring location is also located directly underneath the gripping member. By lowering the gripping member through the recess in the specimen plate, the specimen container can now be placed on the measuring location and can be released for carrying out the measurement by spreading apart the gripping fingers.
A device for charging a measuring apparatus for thermal analysis with material specimens filled into containers, the measuring apparatus including a measuring location, the device comprising a rotatable specimen plate located outside of the measuring apparatus, the specimen plate having a plurality of receiving means for receiving the specimen containers, and a vertically displaceable gripping means for gripping, lifting and transferring the specimen containers from the specimen plate to the measuring location in the measuring apparatus, the gripping means being mounted above the specimen plate and the measuring location.
Dependencies are inferred from the claim text.