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US 5,397,980 AGranted
Current probe calibration fixture
AssigneeHoneywell Inc.
InventorsKerry A. Blose, Leon Henry
Life of this patent
Estimating the term…
Abstract
A current probe calibration fixture in which a pair of conductors of constant dimensions are constructed to surround the coils of the probe and to be spaced from the conductive shield around the coils by a dielectric of constant dimensions so as to assure a uniform desired impedance between the two conductors and minimize excessive currents.
Claims10
Apparatus for use in calibrating a current probe having an e field shield comprising:
- a first conductor having constant dimensions between first and second points along its length;
- a second conductor connected to but insulated from the first conductor between the first and second points, the first and second conductors shaped to closely surround the e field shield of the current probe;
- and
- means spacing the first and second conductors from the e field shield of the probe by an amount sufficient to provide a dielectric of constant dimensions therebetween, the dielectric being chosen to provide a predetermined impedance between the first and second conductors.
1 more element
Dependencies are inferred from the claim text.