Circuit for controlling isolation transistors in a semiconductor memory device
AssigneeSamsung Electronics Co., Ltd.
InventorsSeung-Cheol Oh, Yong-Sik Seok
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Abstract
A semiconductor memory device has adjacent memory arrays and isolation transistors disposed between a common bit sense amplifier and the memory arrays. An isolation control circuit according the present invention generates the power supply voltage Vcc (not the boost voltage Vpp) during the burn-in mode of operation, so that the gate oxide layer of the isolation transistors is prevented from being destroyed or deteriorated.
Claims8
An isolation control circuit for a semiconductor memory device including a bit line sense amplifier, first and second adjacent memory cell arrays that share the bit line sense amplifier, and isolation transistors disposed between the bit line sense amplifier and the first memory cell array and between the bit line sense amplifier and the second memory cell array, comprising:
- a level conversion circuit that receives an address signal and generates a block selection signal;
- a driving circuit that receives said block selection signal and which selectively controls applications of a first voltage and a second boost voltage to said isolation transistors;
- and
- a burn-in control circuit connected to said driving circuit for preventing said second boost voltage from being applied by said driving circuit to said isolation transistors during a burn-in test.
An isolation control circuit for a semiconductor memory device including a bit line sense amplifier, first and second adjacent memory cell arrays that share the bit line sense amplifier, and isolation transistors disposed between said bit line sense amplifier and said first memory cell array and between said bit line sense amplifier and said second memory cell array, comprising:
- level conversion means receiving an address signal, for generating a block selection signal;
- driving means receiving said block selection signal, for selectively controlling applications of a first voltage and a second boost voltage to said isolation transistors;
- and
- burn-in control means connected to said driving means, for preventing said second boost voltage from being applied by said driving means to said isolation transistors during a burn-in test.
Dependencies are inferred from the claim text.