Optimum calibration frequency determination
AssigneeThe Dow Chemical Company
InventorJoel T. Coburn
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AssigneeThe Dow Chemical Company
InventorJoel T. Coburn
Estimating the term…
One aspect of the invention is a method for determining whether systematic biases are present in an instrument. The method involves first obtaining a series of replicates produced by an instrument. Then, a Fourier Transform is performed on that data, thereby generating a secondary spectrum which indicates the frequency characteristics of the data. This secondary spectrum is then compared to secondary spectra obtained in a similar matter from a series of random number sets to determine whether variations observed are within an expected range as defined by the random number series. Another aspect of the invention is a method for determining an optimum frequency at which the instrument should be calibrated. This method comprises obtaining a set of multivariate data as before, and treating every xth data point as a calibration point and adjusting the values of the points following the calibration point accordingly. A Fourier Transform is then calculated as before. Different values for x are tried, and an optimum calibration frequency is deemed to be a value for x in a region which produces a point which is most similar to the distribution of points corresponding to the series of random number sets.
A method for evaluating a sample comprising:
A method for determining an optimum calibration frequency for an analytical instrument comprising:
A method of operating an analytical instrument comprising:
Dependencies are inferred from the claim text.