Multiple stylus probe attachment and methods

A dual probe attachment capable of attachment to a mounting plate of a probing mechanism mounted to a turret tool station of a numerically controlled lathe for probing a front and back face and an inside and outside diameter of a workpiece in a workpiece holder, comprising:

• a base configured for attachment to the mounting plate of the probing mechanism along a longitudinal axis of the probing mechanism such that relative movement between the base and the mounting plate of the probing mechanism is prevented, said base including means for fixedly orienting said base with respect to the probing mechanism in the x and z directions;
• a first probing arm attached to said base at a location offset from the longitudinal axis of the probing mechanism for extension in a direction substantially axially of the workpiece holder, said first probing arm capable of probing an outside diameter, an inside diameter and a front face of the workpiece;
• and
• a second probing arm attached to said base for extension in a direction generally perpendicular to said first probing arm, said second probing arm capable of probing a back face, a front face and an outside diameter of the workpiece.

A probe attachment for attachment to a mounting plate of a probing mechanism mounted to a turret tool station of a numerically controlled lathe, comprising:

• a base configured for attachment to the mounting plate of the probing mechanism at an attachment point located along a longitudinal axis of the probing mechanism such that relative movement between the base and the mounting plate of the probing mechanism is prevented, said base including means for fixedly orienting said base with respect to the probing mechanism in the x and z directions;
• a first probing arm attached to said base at a location offset from the longitudinal axis of the probing mechanism and having a distal end extending outwardly from said base in a first direction;
• and
• a second probing arm attached to said base and having a distal end extending outwardly from said base in a second direction, said second direction being different than said first direction;
• said first and second probing arms attached to said base such that a force applied to said distal end of either of said first and said second probing arms creates a moment about said attachment point tending to cause movement of said base thereby tending to actuate the probing mechanism.

A multiple stylus probe attachment capable of attachment to a mounting plate of a probing mechanism mounted to a turret tool station of a numerically controlled lathe for use in probing various surfaces of a workpiece, comprising:

• a base configured for attachment to the mounting plate of the probing mechanism, said base including means for orienting said base with respect to the probing mechanism in the x and z directions;
• a first stylus attached to said base, said first stylus including a distal end extending in a direction generally parallel to the longitudinal axis of the probing mechanism, said distal end of said first stylus including a first sensing tip;
• and
• a second stylus attached to said base, said second stylus including a distal end extending in a direction generally perpendicular to the longitudinal axis of the probing mechanism, said distal end of said second stylus including a second sensing tip.