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US 5,394,245 AGranted
Process and apparatus for measuring pretilt angle of liquid crystals
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorShigehiro Sato
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AssigneeMatsushita Electric Industrial Co., Ltd.
InventorShigehiro Sato
Estimating the term…
The present invention relates to a method and apparatus for measuring a pretilt angle. The pretilt angle is measured as follows: an alignment layer and a liquid-crystal layer each of which has a refractive index smaller than that of a substrate are laminated on the substrate, a polarized light is emitted into the substrate and made to be reflected on an interface between the substrate and the alignment layer to measure a reflectance, and a ratio of logarithm of reflectances of lights crossing each other is calculated to give a pretilt angle. The apparatus for measuring a pretilt angle comprises a system keeping at least a substrate, a photo system composed of a light source which emits a linear polarized light into the substrate, a detecting system for measuring reflectance of light reflected inside the substrate, and a data-processing system which calculates a pretilt angle from a ratio of logarithm of reflectances of polarized lights crossing each other.
A process for measuring a pretilt angle in which an alignment layer and a liquid-crystal layer each of which has a refractive index smaller than that of a substrate are laminated on the substrate, a polarized light is emitted into the substrate and made to be reflected on an interface between the substrate and the alignment layer, a reflectance, which is given by dividing a reflected-light strength with a liquid crystal layer by that without a liquid crystal layer, is measured, and a ratio of logarithm of reflectances of linear polarized lights crossing each other is calculated.
A process for measuring a pretilt angle in which an alignment layer which has a refractive index smaller than that of a substrate is formed on the substrate, a liquid crystal layer is formed on the alignment layer which has a refractive index smaller than that of the substrate while the alignment layer is kept horizontal, a polarized light is emitted into the substrate and made to be reflected on an interface between the substrate and the alignment layer, a reflectance, which is given by dividing a reflected-light strength with a liquid crystal layer by that without a liquid crystal layer, is measured, and a ratio of logarithm of reflectances of linear polarized lights crossing each other is calculated.
An apparatus for measuring a pretilt angle which comprises:
An apparatus for measuring a pretilt angle which comprises:
Dependencies are inferred from the claim text.