Ambient air refracture index measuring device
AssigneeExcel Precision Corporation
InventorJohn C. Tsai
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AssigneeExcel Precision Corporation
InventorJohn C. Tsai
Estimating the term…
An improved laser refractometer (10) employing a interferometer optical component (12), an object mirror (14) and an etalon (16). The etalon (16) is moved in the path of a plurality of reference beams (22, 24) and a plurality of measurement beams (26, 28) such that the reference beams (22, 24) travel through a vacuum within the etalon while the measurement beams (26, 28) travel a like distance through the etalon (16) in ambient air. In varying the distance traveled by the laser beams (22, 24, 26, 28) within the etalon (16) any interference fringes detected by an interference fringe detection device (20) are attributable to differences in the optical paths of the measurement beams (26, 28) as compared to that of the reference beams (22, 24) which, in turn, is entirely attributable to the ambient index of refraction. In a first preferred embodiment of the improved refractometer (10) the angular distance between a pair of plates (30, 32) is varied by rotation of the etalon (16). In an alternate embodiment of the etalon (516), the distance between plates (530, 532) is varied by linear displacement of the etalon (516).
An improved refractometer comprising:
A method for measuring the ambient refractive index using a laser interferometer, the laser interferometer having a first laser beam and a second laser beam which are directed at a target mirror and then compared to detect changes in the optical paths of the laser beams, the method comprising:
A refractometer for determining the refractive index of ambient air, including:
Dependencies are inferred from the claim text.