Device for testing an amplifier
AssigneesJapan Radio Co., Ltd., NTT Mobile Communications Network, Inc.
InventorsHironori Sakamoto, Akira Ito, Masaaki Fujiwara, Toshio Nojima
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Abstract
A device for testing an amplifier. A plurality of PN modulators are provided corresponding to a plurality of oscillators at stages preceding or following them, or fluctuation is given to division ratios at the oscillators. Since each of n carriers combined by a combiner contains phase fluctuation, the possibility that the peaks will overlap each other or that the carriers having opposite phases will negate each other is very low. The peak power in signals supplied to the amplifier to be tested is unlikely to vary, enabling accurate evaluation or testing.
Claims17
A device for testing or evaluating an amplifier comprising:
- reference oscillation means for generating a reference signal of a predetermined frequency;
- oscillation means for generating test carriers having different frequencies using the reference signal as a phase reference;
- means for combining the test carriers and supplying a resulting signal to the amplifier to be tested;
- and
- phase fluctuation means for differently fluctuating each phase of the test carriers.
A testing device comprising:
- a reference oscillator oscillating at a predetermined frequency;
- a plurality of oscillators using an oscillation output of said reference oscillator as a reference oscillation phase, said plurality of oscillators oscillating at different frequencies;
- a combiner combining oscillation outputs of said plurality of oscillators and supplying a resulting signal to an amplifier to be tested;
- and
- phase fluctuation means for differently fluctuating each oscillation output phase of said plurality of oscillators, the amplifier being tested or evaluated by supplying a plurality of frequency components at a same time.
A method of testing or evaluating an amplifier comprising the steps of:
- generating a reference signal of a predetermined frequency;
- generating test carriers having different frequencies by using the reference signal as a phase reference;
- combining the test carriers and supplying a resulting signal to the amplifier to be tested;
- and
- differently fluctuating each phase of the test carriers.
Dependencies are inferred from the claim text.