Hybrid integrated circuit device having burn-in testing means
AssigneeMitsubishi Denki Kubushiki Kaisha
InventorTakayoshi Kawakami
Life of this patent
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Abstract
A highly reliable hybrid integrated circuit device includes at least one bare chip power MOS-FET and a control IC for controlling the power MOS-FET, both mounted on a circuit substrate. A burn-in test voltage supply line supplies a burn-in test voltage to a gate terminal of the power MOS-FET for a burn-in test. Where a plurality of MOS-FETs are present, burn-in test voltage supply lines connect the gate terminals of the power MOS-FETs to each other. The supply lines are severed to electrically separate the gate terminals from each other after the burn-in test is completed. Alternatively, resistors having a predetermined resistance are inserted in the supply lines so that normal operation, after the burn-in test, is not affected by the gate connections.
Claims3
A hybrid integrated circuit device comprising:
- a plurality of power MOS-FETs in a bare chip state, each of said power MOS-FETs having a gate terminal, a drain terminal, and a source terminal;
- a control IC for supplying a control voltage to said gate terminals of each of said power MOS-FETs to control said power MOS-FETs;
- control voltage supply lines for conducting the control voltage supplied by said control IC to said gate terminals of said power MOS-FETs;
- burn-in test means connected to said gate terminals of each of said power MOS-FETs;
- a plurality of resistors having a predetermined resistance, each resistor respectively connecting said burn-in test means to a gate terminal of one of said power MOS-FETs to prevent interference of said burn-in test means with normal operation of said hybrid integrated circuit device after a burn-in test and for supplying a burn-in test voltage to said gate terminals, the resistors electrically isolating the gate terminals of each power MOS-FET from one another;
- and
- a circuit substrate on which said power MOS-FETs, control IC, control voltage supply line, burn-in test means, and resistors are mounted.
Dependencies are inferred from the claim text.