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US 5,389,875 AGranted
Apparatus for non-destructive testing of dielectric/magnetic materials
AssigneeGrumman Aerospace Corporation
InventorsMark D. A. Rosen, Mark A. Lizza
Life of this patent
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Abstract
A dielectric probe, of the type in which an electromagnetic wave is reflected from a dielectric/magnetic structure and spectrum analyzed, further includes a coil for applying a magnetic field to the structure as the wave is being reflected. Information about the intrinsic electromagnetic properties, integrity and structure of the material is obtained by comparing the reflected spectra for both the magnetic field on and off conditions.
Claims9
A non-destructive test apparatus, comprising:
- means for directing an electromagnetic wave at a structure to cause the wave to reflect from the structure and for guiding the reflection of the wave to an analyzer;
- and
- means for selectively applying a magnetic field to the structure simultaneously with the reflection of the electromagnetic wave from the structure in order to analyze intrinsic electromagnetic properties of the structure,
- wherein said electromagnetic wave directing means is a coaxial cable, said magnetic field applying means comprises a coil wrapped around an outer conductor of said cable, said magnetic field applying means further comprises means for concentrating magnetic flux on said structure, and wherein said flux concentrating means comprises a soft magnetic sleeve surrounding said outer conductor and in turn surrounded by said coil.
1 more element
Dependencies are inferred from the claim text.