Method for forming a film on a substrate by activating a reactive gas
AssigneeKabushiki Kaisha Toshiba
InventorsHaruo Okano, Sadahisa Noguchi, Makoto Sekine
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AssigneeKabushiki Kaisha Toshiba
InventorsHaruo Okano, Sadahisa Noguchi, Makoto Sekine
Estimating the term…
A thin film forming method comprises the steps of supporting a semiconductor substrate having a trench or an unevenness thereon in a reaction vessel; introducing a reactive gas into the vessel; activating the reactive gas to form a deposit species, the deposit species characterized by a phase diagram including a liquid phase region defined by a melting curve and an evaporation curve that intersect at a triple point; and forming a thin film containing at least part of the deposit species on the substrate while retaining a pressure in the vessel higher than the triple point of the phase diagram of the deposit species, and retaining a temperature of the substrate within the liquid phase region of the phase diagram of the deposit species.
A thin film forming method, comprising the steps of:
The thin film forming method of claim 36 wherein the step of activating includes the step of radiating a laser beam with a power of approximately 330 Joul/cm.sup.2 sec.
A thin film forming method, comprising the steps of:
A thin film forming method, comprising the steps of:
A thin film forming method, comprising the steps of:
A thin film forming method, comprising the steps of:
Dependencies are inferred from the claim text.