Scanning electron microscope
AssigneeRj Lee Group, Inc.
InventorsFrederick H. Schamber, Raymond E. Turocy
Life of this patent
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AssigneeRj Lee Group, Inc.
InventorsFrederick H. Schamber, Raymond E. Turocy
Estimating the term…
An improved scanning electron microscope is disclosed which includes a compact, replaceable electron beam emitter assembly and concentric liner tubes. The concentric liner tubes extend through a central portion of electromagnetic lenses for forming an evacuated path for the electron beam. An outer sealing jacket is provided for forming a vacuum seal with the column assembly sufficient to maintain a vacuum within the outer sealing jacket. A conductive inner liner tube positioned within the outer sealing jacket is adapted to have the electron beam pass therethrough. The inner liner tube provides supports for spray baffles and/or beam shaping orifices. The improved electron beam emitter assembly within the gun assembly includes a filament clamped between a front plate and a back plate by clamping screws. The clamping screws additionally hold an adjustable grid against the front plate.
An electron microscope comprising:
An electron microscope comprising:
An electron microscope comprising:
An electron beam emitter assembly comprising:
A method for fabricating an electron microscope emitter assembly which includes a grid member and at least one support member clamping a filament member into position, said method comprising the steps of:
A method for fabricating an electron microscope gun assembly comprising the steps of:
Dependencies are inferred from the claim text.