# US 5,349,290 A · Method for testing semiconductor integrated circuit device, voltage drop power supply circuit suitable for the method, and semiconductor integrated circuit device having the voltage drop circuit > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 5,349,290 A - Document ID: US5349290A - Status: Granted - Kind: A - Application number: 08/052,620 - Filed: 1993-04-27 - Granted: 1994-09-20 - Earliest claimed: 1992-04-27 - Assignees: Fujitsu Limited - Inventors: Toyonobu Yamada - Web page: https://patentgrep.com/patent/US5349290A ## CPC - G01R 31/40: Testing power supplies (testing photovoltaic devices H02S50/10) - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract In a voltage drop power supply circuit for a semiconductor integrated circuit device, a first unit generates a constant internal power supply voltage from an external power supply voltage in accordance with a first characteristic line defining a relationship between the external power supply voltage and the internal power supply voltage, and applies the constant internal power supply voltage to internal circuits of the semiconductor integrated circuit device. A second unit generates a burn-in voltage from the external power supply voltage having a level higher than that used in the normal operation in accordance with a second characteristic line defining a relationship between the external power supply voltage and the internal power supply line, and applies the burn-in voltage to the internal circuits when a burn-in test is carried out for the semiconductor integrated circuit device. The second characteristic line crosses the first characteristic line at an intermediate point between lower and upper limit voltages defined by the first characteristic line. The burn-in voltage is greater than the internal power supply voltage used in the normal operation. ## Claims ### Claim 1 A method of testing a semiconductor integrated circuit device in which internal circuits of the semiconductor integrated circuit device are supplied, in a normal operation, with a constant internal power supply voltage generated from an external power supply voltage in accordance with a first characteristic line defining a relationship between the external power supply voltage and the internal power supply voltage, said method comprising the steps of: generating a burn-in voltage from the external power supply voltage having a level higher than that used in the normal operation in accordance with a second characteristic line defining a relationship between the external power supply voltage and the internal power supply line, the second characteristic line crossing the first characteristic line at an intermediate point between lower and upper limit voltages defined by the first characteristic line, the burn-in voltage being greater than the internal power supply voltage used in the normal operation; and applying the burn-in voltage to the internal circuits of the semiconductor integrated circuit device. ### Claim 2 (depends on 1) The method as claimed in claim 1, wherein a ratio of the internal power supply voltage to the external power supply voltage defined by the first characteristic line is equal to a ratio of the burn-in voltage to the external power supply voltage defined by the second characteristic line. ### Claim 3 (depends on 1) The method as claimed in claim 1, wherein the second characteristic line includes a part of a first straight line obtained by shifting, in parallel, a second straight line connecting an origin at which the internal and external power supply lines are zero to the lower limit voltage of the first characteristic line. ### Claim 4 (depends on 1) The method as claimed in claim 1, wherein the ratio of the burn-in voltage to the external power supply voltage defined by the second characteristic line is constant. ### Claim 5 A voltage drop power supply circuit for a semiconductor integrated circuit device, comprising: first means for generating a constant internal power supply voltage from an external power supply voltage in accordance with a first characteristic line defining a relationship between the external power supply voltage and the internal power supply voltage and for applying the constant internal power supply voltage to internal circuits of the semiconductor integrated circuit device; and second means for generating a burn-in voltage from the external power supply voltage having a level higher than that used in the normal operation in accordance with a second characteristic line defining a relationship between the external power supply voltage and the internal power supply line and for applying the burn-in voltage to the internal circuits when a burn-in test is carried out for the semiconductor integrated circuit device, the second characteristic line crossing the first characteristic line at an intermediate point between lower and upper limit voltages defined by the first characteristic line, the burn-in voltage being greater than the internal power supply voltage used in the normal operation. ### Claim 6 (depends on 5) The voltage drop power supply circuit as claimed in claim 5, further comprising third means for activating said second means when the external power supply voltage reaches the upper limit voltage of the first characteristic line. ### Claim 7 (depends on 5) The voltage drop power supply circuit as claimed in claim 5, wherein said first means comprises means for generating the internal power supply voltage proportional to the external power supply voltage when the semiconductor integrated circuit device performs the normal operation. ### Claim 8 (depends on 5) The voltage drop power supply circuit as claimed in claim 5, wherein said second means comprises: third means for dividing the external power supply voltage and for generating a divided voltage; fourth means, coupled to the third means, for generating the burn-in voltage based on the divided voltage; and fifth means, coupled to the fourth means, for applying the burn-in voltage to the internal circuits only when the burn-in test is carried out for the semiconductor integrated circuit device. ### Claim 9 (depends on 8) The voltage drop power supply circuit as claimed in claim 8, wherein said third means comprises a plurality of resistors connected in series between a first power supply system set at the external power supply voltage and a second power supply system set at a reference potential. ### Claim 10 (depends on 8) The voltage drop power supply circuit as claimed in claim 8, wherein: said third means comprises a level shift element and a resistor connected in series between a first power supply system set at the external power supply voltage and a second power supply system set at a reference potential; and said divided voltage is output via a connection node at which the level shift element and the resistor are connected in series. ### Claim 11 (depends on 8) The voltage drop power supply circuit as claimed in claim 8, further comprising sixth means, coupled to said fifth means, for generating a control signal to said fifth means when the external power supply voltage reaches the upper limit voltage of the first characteristic line, said control signal activating said fifth means so that the burn-in voltage is applied to the internal circuits. ### Claim 12 (depends on 11) The voltage drop power supply circuit as claimed in claim 11, wherein said fifth means comprises a transistor having first and second terminals and a control terminal, the first terminal receiving the burn-in voltage, the second terminal being connected to the internal circuits of the semiconductor integrated circuit device, and the control terminal receiving said control signal. ### Claim 13 (depends on 8) The voltage drop power supply circuit as claimed in claim 8, further comprising sixth means, coupled to said fourth means, for activating said fourth means only when the burn-in test is carried out for the semiconductor integrated circuit device. ### Claim 14 A semiconductor integrated circuit device comprising: first internal circuits operating with an external power supply voltage; second internal circuits operating with a constant internal power supply voltage obtained by dropping the external power supply voltage; first means for generating the constant internal power supply voltage from the external power supply voltage in accordance with a first characteristic line defining a relationship between the external power supply voltage and the internal power supply voltage and for applying the constant internal power supply voltage to the second internal circuits of the semiconductor integrated circuit device; and second means for generating a burn-in voltage from the external power supply voltage having a level higher than that used in the normal operation in accordance with a second characteristic line defining a relationship between the external power supply voltage and the internal power supply line and for applying the burn-in voltage to the second internal circuits when a burn-in test is carried out for the semiconductor integrated circuit device, the second characteristic line crossing the first characteristic line at an intermediate point between lower and upper limit voltages defined by the first characteristic line, the burn-in voltage being greater than the internal power supply voltage used in the normal operation. ### Claim 15 (depends on 14) The voltage drop power supply circuit as claimed in claim 14, further comprising third means for activating said second means when the external power supply voltage reaches the upper limit voltage of the first characteristic line. ### Claim 16 (depends on 14) The voltage drop power supply circuit as claimed in claim 14, wherein said first means comprises means for generating the internal power supply voltage proportional to the external power supply voltage when the semiconductor integrated circuit device performs the normal operation. ### Claim 17 (depends on 14) The voltage drop power supply circuit as claimed in claim 14, wherein said second means comprises: third means for dividing the external power supply voltage and for generating a divided voltage; fourth means, coupled to the third means, for generating the burn-in voltage based on the divided voltage; and fifth means, coupled to the fourth means, for applying the burn-in voltage to the second internal circuits only when the burn-in test is carried out for the semiconductor integrated circuit device.