# US 5,346,849 A · Method of making a groove structure for isolation between elements comprising a GTO thyristor > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 5,346,849 A - Document ID: US5346849A - Status: Granted - Kind: A - Application number: 08/118,192 - Filed: 1993-09-09 - Granted: 1994-09-13 - Earliest claimed: 1990-06-12 - Assignees: Mitsubishi Denki Kabushiki Kaisha - Inventors: Futoshi Tokunoh - Web page: https://patentgrep.com/patent/US5346849A ## CPC - H10W 10/20: Air gaps - H10D 62/104: {having particular shapes of the bodies at or near reverse-biased junctions, e.g. having bevels or moats} - H10D 84/0102: {of thyristors having built-in components, e.g. thyristor having built-in diode} - H10D 84/136: {in anti-parallel configurations, e.g. reverse current thyristor [RCT]} - H10W 10/021: {of air gaps} - Y10S 438/978: forming tapered edges on substrate or adjacent layers - H10W: GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10 - H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES - Y10S: TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS ## Abstract A semiconductor structure comprises a gate-turn-off thyristor region (GR) and a diode region (DR) with an isolation area (SR) therebetween. The isolation area is provided with a multistage groove (30) having step structures (34,35). The multistage groove is formed through a two-stage etching process, and over-etched regions in the bottom corners of the multistage groove are relatively shallow ones. This structure is effective for increasing the breakdown voltage of the semiconductor structure and isolations between the gate-turn-off thyristor region and the diode region. ## Claims ### Claim 1 A method of manufacturing a semiconductor device, comprising the steps of: (a) forming in a semiconductor body first and second semiconductor element structures disposed with an area therebetween in a direction parallel to a major surface of said semiconductor body; (b) selectively etching a part of said major surface of said semiconductor body located in said area to form a groove having a width within said area; and (c) selectively etching said major surface of said semiconductor body in a range including said groove and wider than said groove to form a multistage groove having a depth increasing stepwise in series toward the center thereof. ### Claim 2 (depends on 1) A method as set forth in claim 1, wherein said step (c) comprises the step of: (c-1) selectively etching said major surface of said semiconductor body so as to satisfy conditions; and said conditions includes: a first condition that a step structure having a width of 10% or more of the overall width of said multistage groove is formed in an inner wall portion of said multistage groove. ### Claim 3 (depends on 2) A method as set forth in claim 2, wherein said conditions further includes: a second condition that said multistage groove has a bottom floor whose edge portions are deeper than the central portion of said bottom floor. ### Claim 4 (depends on 3) A method as set forth in claim 3, wherein said conditions further includes: a third condition that said step structure has a step surface defined between a step edge and a step corner; and a fourth condition that said step corner is located at a position lower than said step edge. ### Claim 5 (depends on 4) A method as set forth in claim 4, wherein said conditions further includes: a fifth condition that said position of step corner is higher than a position at which said edge portion of said bottom floor is located. ### Claim 6 (depends on 5) A method as set forth in claim 5, wherein said conditions further includes: a sixth condition that a first distance in height between said position of step corner and said position of said edge portion is larger than a second distance in height between said central portion of said bottom floor and said edge portion of said bottom floor. ### Claim 7 (depends on 6) A method as set forth in claim 6, wherein said conditions further includes: a seventh condition that said position of step corner is higher than said position of said central portion of said bottom floor. ### Claim 8 (depends on 7) A method as set forth in claim 7, wherein said second difference is in the range from 1.0 .mu.m to 1.5 .mu.m. ### Claim 9 (depends on 8) A method as set forth in claim 8, wherein said step (b) comprises the step of: (b-1) selectively etching said part of said major surface of said semiconductor body located in said area so that said groove has a depth which is 15% or more of the depth of said bottom floor of said multistage groove. ### Claim 10 (depends on 9) A method as set forth in claim 9, wherein said step (b-1) comprises the steps of: (b-1-1) forming a first mask layer on said major surface of said semiconductor body: (b-1-2) selectively removing said first mask layer to obtain a first mask pattern having a first window having a size smaller than said area; (b-1-3) selectively etching said part of said major surface of said semiconductor body through said first window; and (b-1-4) removing said first mask pattern. ### Claim 11 (depends on 10) A method as set forth in claim 10, wherein said step (c-1) comprises the steps of: (c-1-1) forming a second mask layer on said major surface of said semiconductor body: (c-1-2) selectively removing said second mask layer to obtain a second mask pattern having a second window adapted to said area; (c-1-3) selectively etching said part of said major surface of said semiconductor body through said second window; and (c-1-4) removing said second mask pattern. ### Claim 12 (depends on 9) A method as set forth in claim 9, wherein said step (b-1) comprises the steps of: (b-1-1) forming a first mask layer on said major surface of said semiconductor body: (b-1-2) selectively removing said first mask layer to obtain a first mask pattern having a first window having a size smaller than said area; and (b-1-3) selectively etching said part of said major surface of said semiconductor body through said first window; and said step (c-1) comprises the steps of: (c-1-1) selectively removing said first mask pattern to obtain a second mask pattern having a second window adapted to said area; (c-1-3) selectively etching said part of said major surface of said semiconductor body through said second window; and (c-1-4) removing said second mask pattern.