Method and apparatus for interim, in-situ testing of an electronic system with an inchoate ASIC

A method of simulating the performance of an inchoate ASIC having a core cell and surrounding logic, comprising:

• providing a pod having a functional model of the core cell, programmable logic devices, a plug whose pine configuration matches that of the inchoate ASIC, and connections between the programmable logic devices, the functional model, and the plug;
• configuring the programmable logic devices as surrogate surrounding logic;
• and
• operating the pod to perform in a manner which is functionally equivalent to the performance of the inchoate ASIC.

Apparatus for testing the performance of a target electronic system ultimately employing an ASIC comprising a core cell and surrounding logic, using an inchoate ASIC on an interim basis, comprising:

• an interim electronic system, equivalent to the target electronic system without the inchoate ASIC;
• a socket on the interim electronic system carrying all connections to the inchoate ASIC;
• a separate pod having a plug for plugging into the socket, said pod further comprising:
• a functional model of the core cell;
• at least one programmable logic device, said programmable logic device(s) configured as surrogate surrounding logic;
• means for providing connections between the programmable logic device)s), the functional model of the core cell, and the plug;
• and
• means for plugging the pod into the interim electronic system.