US 5,337,014 A · Phase noise measurements utilizing a frequency down conversion/multiplier, direct spectrum measurement technique

Abstract

An improved circuit for phase noise measurements utilizing a frequency down conversion/multiplier and direct spectrum measurement technique. The circuit is particularly useful for field test environments where laboratory instrumentation is normally not available, and fast and accurate phase noise measurements are required. The phase noise measuring circuit includes a frequency mixer which has a first input signal from a device under test and a second input signal from a reference stable oscillator having ultra low phase noise with a fixed center frequency. The frequency mixer produces a down converted signal comprising the frequency difference signal of the first and second input signals. A lowpass filter passes the down converted signal to a frequency multiplier circuit which produces a second harmonic signal, a fourth harmonic signal, and higher harmonic signals of the down converted signal. A narrow bandpass filter passes a selected one of the second or higher harmonic signals to a low noise amplifier, the output of which is passed to a direct approach spectrum analyzer for measurement of the phase noise of the device under test. A second embodiment includes an additional multiplication stage which includes a second frequency multiplier circuit, a second narrow bandpass filter, and a second low noise amplifier, the output of which is passed to the direct approach spectrum analyzer for measurement of he phase noise of the device under test.

Claims16

Dependent claims

A phase noise measuring circuit for measuring the noise a device under test, comprising:

a. a frequency mixer circuit, having a first input signal from a device under test and a second input signal from a reference stable oscillator having ultra low phase noise and a fixed center frequency, for mixing the first and second input signals to produce a down converted signal comprising the frequency difference signal of the first and second input signals;
b. a down converted signal lowpass filter for passing the down converted signal;
c. a frequency multiplier circuit, having the down converted signal as an input, for producing at its output a second harmonic signal, a fourth harmonic signal, an eighth harmonic signal, a sixteenth harmonic signal, and higher harmonic signals, of the down converted signal;
d. a narrow bandpass filter, coupled to the output of said frequency multiplier circuit, for passing to its output one of the second harmonic, fourth harmonic, eighth harmonic, sixteenth harmonic, or higher harmonic, signals of the frequency multiplier circuit;
e. an amplifier, coupled to the output of said narrow bandpass filter, for multiplying the output signal of the narrow bandpass filter and passing the amplified signal to its output;
and
f. a direct approach spectrum analyzer, connected directly to said amplifier output, for analyzing the output signal of said amplifier to measure the phase noise of the device under test.

4 more elements

A phase noise measuring circuit for measuring the phase noise of a device under test, comprising:

a. a frequency mixer circuit, having a first input signal from a device under test and a second input signal from a reference stable oscillator having ultra low phase noise and a fixed center frequency, for mixing the first and second input signals to produce a down converted signal comprising the frequency difference signal of the first and second input signals;
b. a down converted signal lowpass filter for passing the down converted signal;
c. a frequency multiplier circuit, having the down converted signal as an input, for producing at its output a second harmonic signal, a fourth harmonic signal, an eighth harmonic signal, a sixteenth harmonic signal, and higher harmonic signals, of the down converted signal;
d. a narrow bandpass filter, coupled to the output of said frequency multiplier circuit, for passing to its output one of the second harmonic, fourth harmonic, eighth harmonic, sixteenth harmonic, or higher harmonic, signals of the frequency multiplier circuit;
e. an amplifier, coupled to the output of said narrow bandpass filter, for amplifying the output signal of said narrow bandpass filter and passing the amplified signal to its output;
f. a second frequency multiplier circuit, coupled to the output of said amplifier, for producing at an output a second harmonic signal, a fourth harmonic signal, an eighth harmonic signal, a sixteenth harmonic signal, and higher harmonic signals, of the output signal of said amplifier;
g. a second narrow bandpass filter, coupled to the output of said second frequency multiplier circuit, for passing to its output one of the second harmonic, fourth harmonic, eighth harmonic, sixteenth harmonic, or higher harmonic, signals of said second frequency multiplier circuit;
h. a second amplifier, coupled to the output of said second narrow bandpass filter, for amplifying the output signal of said second narrow bandpass filter and passing the amplified signal to its output;
and
i. a direct approach spectrum analyzer, connected directly to said second amplifier output, for analyzing the output signal of said second amplifier to measure the phase noise of the device under test.

7 more elements

Dependencies are inferred from the claim text.

Phase noise measurements utilizing a frequency down conversion/multiplier, direct spectrum measurement technique

Life of this patent

Phase noise measurements utilizing a frequency down conversion/multiplier, direct spectrum measurement technique

Life of this patent

Abstract

Claims16