US 5,335,024 A · Automatic kinescope bias arrangement

Abstract

An automatic kinescope bias (AKB) arrangement embodied in an integrated circuit (IC) includes circuitry for generating a timing signal during an AKB test interval, circuitry for generating a test signal in response to the timing signal, and circuitry including an output terminal for coupling the test signal to the kinescope. The AKB IC also includes an input terminal and a switching element coupled between the input terminal and the output terminal and responsive to the timing signal for selectively decoupling the input terminal from the output terminal. In a television system which includes a bias network which is coupled to the output of the video signal source and which inhibits the kinescope from being cutoff during the AKB test interval, the input terminal of the AKB IC is coupled to the output terminal of the video signal source. This allows the bias network to be decoupled from the display device during the AKB test interval, thereby preventing the bias network from affecting AKB operation. Alternatively, in a television system which does not include a bias network which inhibits the kinescope from being cutoff during the AKB test interval, the output terminal of the AKB IC is directly coupled to the output terminal of the video signal source.

Claims10

Dependent claims

A television system comprising:

a display device;
a source of a video signal;
means for amplifying said video signal to produce an amplified version of said video signal;
said amplifying means including an input portion coupled to said source and an output portion coupled to said display device;
means for providing a bias signal for said display device coupled to said input portion of said amplifying means;
and
an integrated circuit including an input terminal coupled to said input portion of said amplifying means;
an output terminal coupled to said output portion of said amplifying means;
a sense terminal coupled to said output portion of said amplifying means;
means for generating a timing signal during a test interval;
means for generating a test signal in response to said timing signal;
means coupled to said output terminal for coupling said test signal to said display device via said output portion of said amplifying means;
means coupled to said sense terminal for generating a correction signal in response to said test signal;
means coupled to said output terminal for coupling said correction signal to said display device via said output portion of said amplifying means;
and a switching element coupled between said input and output terminals for selectively decoupling said input and output portions of said amplifying means and thereby decoupling said bias signal from said display device in response to said timing signal.

12 more elements

Dependencies are inferred from the claim text.

Automatic kinescope bias arrangement

Life of this patent

Automatic kinescope bias arrangement

Life of this patent

Abstract

Claims10