Molded test probe assembly

A probe tip sub-assembly, comprising:

• a body block having a cantilevered portion and an attachment portion, said body block comprising plastic and being formed of an injection molded plastic,
• a contact tip located on said cantilevered portion and
• a conductive material overlying at least a portion of said body block from said contact tip to said attachment portion, said conductive material being formed and applied as a conductor strip,
• wherein said body block includes a hole formed therein, said contact tip being positioned in said hole and affixed to said conductor strip such that a portion of said contact tip protrudes from a surface of said conductor strip for engagement with said hole in said body block.

A probe tip for contacting and testing an object including:

• a body block including a cantilevered portion and an attachment portion and being formed with a groove such that said cantilevered portion is substantially separated from said attachment portion by said groove and such that said cantilevered portion has a predetermined resiliency, said body block comprising plastic,
• a contact tip located on said cantilevered portion,
• a conductive material overlying at least a portion of said body block from said contact tip to said attachment portion and
• a holder block shaped to cover at least said attachment portion of said body block,
• said body block and said holder block each including a portion of an attachment means for attaching said holder block and said body block together in a predetermined positional relationship,
• said contact tip for traversing a surface of said object and wiping contaminants therefrom upon said contact tip being brought into contact with said object and until a limit of said predetermined resiliency of said cantilevered portion is reached.