Thin-film transistor having source and drain electrodes insulated by an anodically oxidized film
AssigneeCasio Computer Co., Ltd.
InventorKunihiro Matsuda
Life of this patent
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Abstract
A thin-film transistor panel comprises an insulative substrate, a plurality of thin-film transistor elements arranged at predetermined intervals on said substrate, and wirings electrically connecting the thin-film transistor elements characterized in that the thin-film transistor element comprises a gate electrode, a gate-insulating film, an i-type semiconductor layer to face the gate electrode through the gate insulating film therebetween, an n-type semiconductor layer, source and drain electrodes electrically connected the portions of the i-type semiconductor layer through the n-type semiconductor layer, and an anodically oxidized film located between the source and drain electrodes to electrically isolate, said source and drain electrodes.
Claims20
A thin-film transistor comprising an insulative substrate and a thin-film transistor element arranged on the substrate, said thin-film transistor element comprising:
- a gate electrode;
- a gate-insulating film;
- an i-type semiconductor layer to face the gate electrode through the gate insulating film therebetween;
- an n-type semiconductor layer having an anodically oxidized region;
- source and drain electrodes electrically connected to portions of the i-type semiconductor layer through the n-type semiconductor layer and having anodically oxidized surface regions for protecting said source and drain electrodes and isolated from each other by the anodically oxidized region of said n-type semiconductor layer which is located between said source and drain electrodes;
- and
- a data line electrically connected to said drain electrode and having an anodically oxidized surface region for protecting said data line.
A thin-film transistor panel comprising an insulative substrate and a plurality of thin-film transistor elements arranged at predetermined intervals on the substrate, and connecting means electrically connecting said thin-film transistor elements, each of said thin-film transistor elements comprising:
- a gate electrode;
- a gate-insulating film;
- an i-type semiconductor layer to face the gate electrode through the gate insulating film therebetween;
- an n-type semiconductor layer having an anodically oxidized region;
- and
- source and drain electrodes electrically connected to portions of the i-type semiconductor layer through the n-type semiconductor layer and having anodically oxidized surface regions for protecting said source and drain electrodes and isolated from each other by the anodically oxidized region of said n-type semiconductor layer which is located between said source and drain electrodes;
- said connecting means including data lines electrically connected to said drain electrodes of said thin-film transistor elements, and having an anodically oxidized surface region.
A thin-film transistor panel comprising a plurality of thin-film transistor elements arranged in a matrix form, and data lines and gate lines connected to said thin-film transistor elements,
- each of said thin-film transistor elements comprising:
- a gate electrode;
- a gate-insulating film;
- an i-type semiconductor layer to face the gate electrode through the gate insulating film therebetween;
- an n-type semiconductor layer having an anodically oxidized region;
- and
- source and drain electrodes electrically connected to the portions of the i-type semiconductor layer through the n-type semiconductor layer and isolated from each other by the anodically oxidized region of said n-type semiconductor layer which is located between said source and drain electrodes;
- and
- each of said data lines having an anodically oxidized surface region.
A thin-film transistor panel comprising an insulative substrate, thin-film transistor elements arranged in a matrix form on the substrate, and pixel electrodes connected to the thin-film transistor elements, each of said thin-film transistor elements comprising:
- a gate electrode;
- a gate-insulating film;
- an i-type semiconductor layer to face the gate electrode through the gate insulating film therebetween;
- an n-type semiconductor layer;
- source and drain electrodes;
- a first contact layer and a first transparent conductive film located between said source electrode and said n-type semiconductor layer for providing an ohmic contact between said source electrode and said n-type semiconductor layer, and
- a second contact layer and a second transparent conductive film located between said drain electrode and said n-type semiconductor layer for providing an ohmic contact between said drain electrode and said n-type semiconductor layer,
- the first transparent conductive films located between said source electrodes and said n-type semiconductor layers are integrally formed with the pixel electrodes, and said drain electrodes cover respective ones of said second transparent conductive films.
Dependencies are inferred from the claim text.