Method of determining conditions for plasma silicon nitride film growth and method of manufacturing semiconductor device
AssigneeSony Corporation
InventorsToshinobu Sugiyama, Hiroshi Sakurai
Life of this patent
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Abstract
A silicon nitride film is deposited on a semiconductor substrate in a plasma generated with SiH.sub.4 and nitride gases by the application of high-frequency electric energy. An allowable range of ultraviolet radiation absorption rates of the silicon nitride film, and also an allowable range of inner stresses of the silicon nitride film are established. Levels of both the flow rate of the SiH.sub.4 gas and the high-frequency electric energy are determined so that the silicon nitride film will satisfy the allowable range of ultraviolet radiation absorption rates with a wide margin and the allowable range of inner stresses with a wide margin.
Claims13
A method of determining conditions for the growth of a silicon nitride film in a plasma generated with SiH.sub.4 and nitride gases by the application of high-frequency electric energy, comprising the steps of:
- establishing an allowable range of ultraviolet radiation absorption rates of the silicon nitride film;
- establishing an allowable range of inner stresses of the silicon nitride film, said range of inner stresses being from -3.0.times.10.sup.9 to -7.0.times.10.sup.9 dyn/cm.sup.2 ;
- and
- controlling levels of both the flow rate of the SiH.sub.4 gas and the high-frequency electric energy to cause the silicon nitride film to satisfy said allowable range of ultraviolet radiation absorption rates and said allowable range of inner stresses.
A method of manufacturing a semiconductor device having an overcoat layer in the form of a silicon nitride film in a plasma generated with SiH.sub.4 and nitride gases by the application of high-frequency electric energy, comprising the steps of:
- establishing an allowable range of ultraviolet radiation absorption rates of the silicon nitride film;
- establishing an allowable range of inner stresses of the silicon nitride film;
- said allowable range of inner stresses being from -3.0.times.10.sup.9 to -7.0.times.10.sup.9 dyn/cm.sup.2 ;
- determining levels of both the flow rate of the SiH.sub.4 gas and the high-frequency electric energy to cause the silicon nitride film to satisfy said allowable range of ultraviolet radiation absorption rates and said allowable range of inner stresses;
- and
- supplying the SiH.sub.4 gas at the determined flow rate and applying the high-frequency electric power at the determined level to generate a plasma for forming the silicon nitride film therein.
A method of determining a condition for forming a plasma silicon nitride film, for use as an overcoat layer of an ultraviolet erasable programmable rad-only memory, by plasma chemical vapor deposition using a SiH.sub.4 gas and a nitride gas under the control of microwave energy, said method comprising the steps of:
- establishing a correlationship between the flow rate of the SiH.sub.4 gas and the microwave energy in view of an internal stress of the plasma silicon nitride film and an ultraviolet absorbed dose of the plasma silicon nitride film;
- and
- controlling levels of the flow rate of the SiH.sub.4 gas and the microwave energy for forming the plasma silicon nitride film so that the plasma silicon nitride film will fulfill both an allowable range of internal stresses of a range from -3.0.times.10.sup.9 to -7.0.times.10.sup.9 dyn/cm.sup.2 for the plasma silicon nitride film and an allowable range of ultraviolet absorbed doses of the plasma silicon nitride film.
A method of determining conditions for the growth of a silicon nitride film in a plasma generated with SiH.sub.4 and nitride gases by the application of high-frequency electric energy, comprising the steps of:
- establishing an allowable range of ultraviolet radiation absorption rates of the silicon nitride film, said allowable range at most being 0.7 abs/1000.ANG.;
- and
- establishing an allowable range of inner stresses of the silicon nitride film;
- and
- controlling levels of both the flow rate of the SiH.sub.4 gas and the high-frequency electric energy to cause the silicon nitride film to satisfy said allowable range of ultraviolet radiation absorption rates and said allowable range of inner stresses.
A method of manufacturing a semiconductor device having an overcoat layer in the form of a silicon nitride film in a plasma generated with SiH.sub.4 and nitride gases by the application of high frequency electric energy, comprising the steps of:
- establishing an allowable range of ultraviolet radiation absorption rates of the silicon nitride film, said allowable range of ultraviolet radiation rates being at most 0.7 abs/1000.ANG.;
- establishing an allowable range of inner stresses of the silicon nitride film;
- determining levels of both the flow rate of the SiH.sub.4 gas the high-frequency electric energy to cause the silicon nitride film to satisfy said allowable range of ultraviolet radiation absorption rates and said allowable range of inner stresses;
- and
- supplying the SiH.sub.4 gas at the determined flow rate and applying the high-frequency electric power at the determined level to generate a plasma for forming the silicon nitride film therein.
A method of determining a condition for forming a plasma silicon nitride film, for use as an overcoat layer of an ultraviolet erasable programmable read-only memory, by plasma chemical vapor deposition using a SiH.sub.4 gas and a nitride gas under the control of microwave energy, said method comprising the steps of:
- establishing a correlationship between the flow rate of the SiH.sub.4 gas and the microwave energy in view of an internal stress of the plasma silicon nitride film and an ultraviolet absorbed dose of the plasma silicon nitride film;
- and
- controlling levels of the flow rate of the SiH.sub.4 gas and the microwave energy for forming the plasma silicon nitride film so that the plasma silicon nitride film will fulfill both an allowable range of internal stresses of the plasma silicon nitride film and an allowable range of ultraviolet absorbed doses at the most 0.7 abs/1000.ANG. for the plasma nitride film.
Dependencies are inferred from the claim text.