Polarizing interferometric displacement measuring arrangement
AssigneeDr. Johannes Heidenhain GmbH
InventorsDieter Michel, Erwin Spanner
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Abstract
A polarizing optical arrangement wherein a linearly polarized signal beam cluster is generated. The signal beam cluster is created from interfering partial beam clusters and is linearly polarized. The azimuth of oscillation of the linearly polarized signal beam cluster is dependent on the mutual phase relationship of the aforementioned partial beam clusters. A splitter grating splits the linearly polarized signal beam cluster into partial beam clusters that are analyzed by analyzers, detected by photoelectric transducers and phase-shifted electrically from one another.
Claims11
A polarizing optical arrangement for generating phase-shifted signals in interferometric measuring instruments comprising:
- means for generating a linearly polarized signal beam cluster from interfering partial beam clusters, said polarized signal beam cluster having an azimuth of oscillation dependent upon the mutual phase relationship of said interfering partial beam clusters;
- a splitter grating for splitting said polarized signal beam cluster to generate at least two beam clusters;
- and
- means for detecting said generated beam clusters created by said splitter grating to create detected signals, said detected signals having a mutual phase relationship dependent upon the orientation of analyzers located between said splitter grating and said means for detecting in the path of said generated beam clusters.
A polarizing optical arrangement for generating phase-shifted signals in interferometric measuring instruments comprising:
- means for generating a linearly polarized signal beam cluster from interfering partial beam clusters, said polarized signal beam cluster having an azimuth of oscillation dependent upon the mutual phase relationship of said interfering partial beam clusters;
- a splitter grating for splitting said polarized signal beam cluster to generate at least two beam clusters;
- means for analyzing said generated beam clusters from said splitter grating orientated in the path of said generated beams;
- and
- means for detecting said generated beam clusters created by said splitter grating to create detected signals, said detected signals having a mutual phase relationship dependent upon the orientation of said analyzers.
A method for generating phase-shifted signals in interferometric measuring instruments using a polarizing optical arrangement comprising the steps of:
- generating a linearly polarized signal beam cluster from interfering partial beam clusters, said polarized signal beam cluster having an azimuth of oscillation dependent upon the mutual phase relationship of said interfering partial beam clusters;
- splitting said polarized signal beam cluster to generate at least two beam clusters;
- and
- detecting said generated beam clusters created by said splitter grating to create detected signals, said detected signals having a mutual phase relationship dependent upon the orientation of analyzers located between said splitter grating and said means for detecting in the path of said generated beam clusters.
A polarizing optical arrangement for generating phase-shifted signals in interferometric measuring instruments comprising:
- beam paths;
- a beam splitter for splitting a linearly polarized beam cluster into at least two
- a half-wave plate disposed in one beam path;
- a beam uniter located downstream of the half-wave plate for uniting the beams in the beam paths;
- a quarter wave plate for receiving the beam from the beam uniter and generating a linearly polarized beam having an azimuth of oscillation which depends upon the mutual phase relationship of the partial beam clusters;
- a splitter grating for splitting the polarized signal beam cluster to generate at least two beam clusters;
- and
- means for detecting the generated beam clusters created by the splitter grating to create detected signals, said detected signals having a mutual phase relationship dependent upon the orientation of analyzers located between said splitter grating and said means for detecting in the path of said generated beam clusters.
Dependencies are inferred from the claim text.