Method and apparatus for all code testing
AssigneeAT&T Bell Laboratories
InventorsMiroslaw Guzinski, James L. Lewandowski, Victor J. Velasco, Shianling Wu
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AssigneeAT&T Bell Laboratories
InventorsMiroslaw Guzinski, James L. Lewandowski, Victor J. Velasco, Shianling Wu
Estimating the term…
A device (12), such as an A/D converter for generating successive codes, each in accordance with the level of an input analog voltage, may be tested to determine if all codes have been generated by applying a voltage V.sub.t having an amplitude that varies between 0 and V volts. The variation in the voltage V.sub.t is such that when the device (12) is operating properly, it will generate all of its codes during a predetermined interval. Each code generated by the device (12) is compared by a comparator (18) to the count of an n-bit counter (20) whose count is initialized at zero. Each time the count of the counter (20) matches the code produced by the device (12), the counter is incremented. If the counter overflows (i.e., its count has exceeded 2.sup.n -1) within a prescribed interval, then the device (12) is said to be operating properly.
A method for testing an n-bit-wide analog-to-digital converter which generates a separate one of a set of codes, each in response to a corresponding amplitude of analog voltage applied thereto, to determine if the converter can generate all of its codes, comprising the steps of:
Apparatus for testing an n-bit-wide analog-to-digital converter which generates one of a set of codes, each in response to a corresponding amplitude of analog voltage applied thereto, to determine if the converter can generate all of its codes, the apparatus comprising:
Dependencies are inferred from the claim text.