US 5,331,284 A · Meter and method for in situ measurement of the electromagnetic properties of various process materials using cutoff frequency characterization and analysis

Abstract

An apparatus and method for the measurement of, for example, the moisture in a material or, more generally, for the measurement of any material parameter which may be inferred by measuring the electromagnetic properties of the material under investigation. The meter apparatus comprises a controllable source of electromagnetic energy having stable selectable frequency. The controllable source of electromagnetic energy is coupled to a material measurement chamber by means of probes, loops, antennas, apertures or other structures so as to establish an electromagnetic field inside the measurement chamber thereby causing the field to interact with the material contained in the chamber. The method includes passing the process material through a frequency sensitive measurement cell. Exposing the process material to electromagnetic energy produced by a multi-frequency source. Generating an output signal having a distinctive frequency response characteristic. Detecting and amplifying an output signal by a receiving means and converting the signal to a digital representation. Analyzing the digital representation of the signal by the computer to determine the cutoff frequency. Determining the sharpness of the cutoff characteristic by mathematical algorithms in the computer. From the measured cutoff frequency and the sharpness of the cutoff characteristic, determining the dielectric constant and the conductivity of the material. Using stored calibration data or equations in the computer, computing and displaying the desired material property, e.g., the material's moisture content. And further, using the passband attenuation to determine the density of the material.

Claims2

Dependent claims

An electromagnetic property meter for the in situ measurement of any parameter of a material which may be inferred by measuring the electromagnetic properties of the material under investigation comprising:

(a) a source for generating controllable electromagnetic energy, the energy generated by said source having stable selectable frequencies and associated wavelengths, said source operable for generating a frequency range,
(b) a material measurement chamber in operative association with said source for receiving the energy generated by said source, said chamber having an energy confining boundary, the boundary having a coupling inlet for receiving the energy from said source into said chamber and a coupling outlet for egressing energy from said chamber, further, the boundary having dimensions so as to exhibit a cutoff condition falling within the operating limits of said source, the cutoff condition being the frequency dependent attenuation characteristic observed when the operating frequency falls below an effective cutoff frequency, the effective cutoff frequency being the frequency for which propagation ceases for an equivalent lossless material filling said chamber, such that a chamber signal is generated in said chamber representative of the material in said chamber affecting the amplitude or phase characteristics of the energy coupled across said chamber,
(c) a detector in operative association with the coupling outlet of the boundary of said chamber for receiving the chamber signal from said chamber, said detector responsive to the chamber signal having interacted with the material in said chamber and having been influenced by the cutoff condition of said chamber such that said detector generates a detector signal which is a function of the interacted and influenced energy, and
(d) a processor for receiving the detector signal from said detector for determining the properties of the material.

1 more element

Dependencies are inferred from the claim text.

Meter and method for in situ measurement of the electromagnetic properties of various process materials using cutoff frequency characterization and analysis

Life of this patent

Meter and method for in situ measurement of the electromagnetic properties of various process materials using cutoff frequency characterization and analysis

Life of this patent

Abstract

Claims2