Surface inspection method and device with irradiation
AssigneeMazda Motor Corporation
InventorsKazumoto Tanaka, Kazuo Hironaka, Yoshimi Shimbara
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Abstract
An inspection method including the steps of irradiating a light with a predetermined changing pattern onto a substantially specular surface to be inspected through an irradiation device facing the surface, forming an image based on reflected light in correspondence with the predetermined changing pattern by an imaging device, and utilizing reflected light of only 200-350 nm wavelength to form the image so as to detect a flaw in the surface by identifying points which differ from the changing pattern of the irradiation device. The flaws in the coating can be detected with a high accuracy irrespective of the color of the coating surface. An inspection device is also provided for the same object.
Claims5
An inspection method comprising the steps of:
- irradiating light having a predetermined changing pattern onto a substantially specular surface to be inspected by an irradiation device facing the surface,
- forming an image based on reflected light in correspondence with the predetermined changing pattern by means of an imaging device, and
- utilizing reflected light of 200-350 nm wavelength only to form the image so as to detect a flaw in the surface by identifying points which differ from the predetermined changing pattern of the light.
An inspection device comprising:
- irradiation means for irradiating light having a predetermined changing pattern onto a substantially specular surface to be inspected,
- image forming means for forming an image in correspondence with the predetermined changing pattern irradiated by the irradiation means based on reflected light within a wavelength of 200-350 nm only, and
- image processing means for detecting a flaw on the surface based on the image formed by the image forming means.
Dependencies are inferred from the claim text.