US 5,330,883 A · Techniques for uniformizing photoresist thickness and critical dimension of underlying features

Abstract

Changing (varying, irregular) resist thickness on semiconductor wafers having irregular top surface topography or having different island sizes, affects the percent reflectance (and absorption efficiency) of incident photolithographic light, and consequently the critical dimensions of underlying features being formed (e.g., polysilicon gates). A low solvent content resist solution that can be applied as an aerosol provides a more uniform thickness resist film, eliminating or diminishing photoresist thickness variations. A top antireflective coating (TAR) also aids in uniformizing reflectance, despite resist thickness variations. The two techniques can be used alone, or together. Hence, better control over underlying gate size can be effected, without differential biasing.

Claims3

Dependent claims

Method of fabricating semiconductor features having uniform critical dimensions (cd's), comprising:

applying a film of photoresist over a semiconductor wafer, for defining underlying features having critical cd's;
applying a top antireflective coating of a partially-fluorinated compound selected from the group consisting of:
(a) R.sub.f CH.sub.2 CH.sub.2 SCH.sub.2 CH.sub.2 CO.sub.2 Li;
(b) (R.sub.f CH.sub.2 CH.sub.2 O)P(O)(ONH.sub.4).sub.2 ;
(c) (R.sub.f CH.sub.2 CH.sub.2 O).sub.2 P(O)(ONH.sub.4);
(d) (R.sub.f CH.sub.2 CH.sub.2 O)P(O)(OH).sub.2 ;
(e) (R.sub.f CH.sub.2 CH.sub.2 O).sub.2 P(O)(OH);
(f) R.sub.f CH.sub.2 CH.sub.2 SCH.sub.2 CH.sub.2 N.sup.+ (CH.sub.3).sub.3 CH.sub.3 SO.sub.4.sup.- ;
(g) R.sub.f CH.sub.2 CH(OCOCH.sub.3)CH.sub.2 N.sup.+ (CH.sub.3).sub.2 CH.sub.2 CO.sub.2.sup.- ;
(h) R.sub.f CH.sub.2 CH.sub.2 SO.sub.3 X (X=H and NH.sub.4);
wherein:
R.sub.f =F(CF.sub.2 CF.sub.2).sub.3-8
over the film of photoresist;
and
exposing the photoresist to masked light to form a pattern in the photoresist, said pattern defining the underlying features.

12 more elements

Dependencies are inferred from the claim text.

Techniques for uniformizing photoresist thickness and critical dimension of underlying features

Life of this patent

Techniques for uniformizing photoresist thickness and critical dimension of underlying features

Life of this patent

Abstract

Claims3