Nonvolatile random access memory
AssigneeCalifornia Institute of Technology
InventorsJiin-Chuan Wu, Henry L. Stadler, Romney R. Katti
Life of this patent
Estimating the term…
Loading patent…
AssigneeCalifornia Institute of Technology
InventorsJiin-Chuan Wu, Henry L. Stadler, Romney R. Katti
Estimating the term…
A nonvolatile magnetic random access memory can be achieved by an array of magnet-Hall effect (M-H) elements. The storage function is realized with a rectangular thin-film ferromagnetic material having an in-plane, uniaxial anisotropy and inplane bipolar remanent magnetization states. The thin-film magnetic element is magnetized by a local applied field, whose direction is used to form either a "0" or "1" state. The element remains in the "0" or "1" state until a switching field is applied to change its state. The stored information is detcted by a Hall-effect sensor which senses the fringing field from the magnetic storage element. The circuit design for addressing each cell includes transistor switches for providing a current of selected polarity to store a binary digit through a separate conductor overlying the magnetic element of the cell. To read out a stored binary digit, transistor switches are employed to provide a current through a row of Hall-effect sensors connected in series and enabling a differential voltage amplifier connected to all Hall-effect sensors of a column in series. To avoid read-out voltage errors due to shunt currents through resistive loads of the Hall-effect sensors of other cells in the same column, at least one transistor switch is provided between every pair of adjacent cells in every row which are not turned on except in the row of the selected cell.
An array of nonvolatile magnetic random access memory cells arranged in rows and columns, each cell having
A nonvolatile random access memory comprising a plurality of nonvolatile magnetic random access memory cells arranged in a matrix of rows and columns, each cell having a Hall-effect sensor of semiconductor material and a magnetic storage element, said Hall-effect sensor comprising a rectangular shape of said semiconductor material having a length oriented along one of said rows and said magnetic storage element comprising a thin-film layer of magnetic material having a discrete width and a length greater than said width oriented along one of said columns, said magnetic material having an in-plane uniaxial anisotropy and in-plane bipolar remanent magnetization states oriented along one of said columns, said magnetic storage element being positioned with one end having said discrete width near the center of said Hall-effect sensor,
A nonvolatile random access memory comprising a plurality of nonvolatile magnetic random access memory cells arranged in a matrix of rows and columns, each cell having a Hall-effect sensor of semiconductor material and a magnetic storage element, said Hall-effect sensor comprising a rectangular shape of said semiconductor material having a length oriented along one of said rows and said magnetic storage element comprising a thin-film layer of magnetic material having a discrete width and a length greater than said width oriented along one of said columns, said magnetic material having an in-plane uniaxial anisotropy and in-plane bipolar remanent magnetization states oriented along one of said columns, said magnetic storage element being positioned with one end having said discrete width near the center of said Hall-effect sensor,
Dependencies are inferred from the claim text.