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US 5,329,133 AGranted
Method of automatically determining flaws of an object of examination
AssigneeFurukawa Electric Co., Ltd.
InventorsKenji Uesugi, Michihiro Shimada
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AssigneeFurukawa Electric Co., Ltd.
InventorsKenji Uesugi, Michihiro Shimada
Estimating the term…
In a method of automatically determining flaws of an object of examination according to the invention, rays of light are transmitted through on object of examination, while adjusting the depth of observation to make it agree with the focal length of a detected flaw, go down deeper than the focal length and come up shallower than the focal length and the brightness of transmitted light for each depth of observation is converted into a corresponding electric signal. Portions of the generated signal that are found outside a predetermined range of intensity are taken out as flaw signals and the obtained flaw signals are compared with a number of binarized flaw patterns prepared from various flaws that have been detected in advance to accurately determine the type, number and size of the detected flaws.
A method of automatically determining flaws of an object under examination by transmitting rays of light through the object to detect flaws on and in the object on a one by one basis, the method comprising the steps of:
A method of automatically determining flaws of an insulated cable having an inner or outer semi-conductive layer and an adjoining insulation layer comprising the steps of:
Dependencies are inferred from the claim text.