Apparatus for sampling a material travelling past a sampling region
AssigneeInfrared Engineering Limited
InventorPeter H. Hindle
Life of this patent
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AssigneeInfrared Engineering Limited
InventorPeter H. Hindle
Estimating the term…
A sampling system includes a plurality of sensing means (3) mounted on one or more beams (2) which reciprocate, over a moving web (1) of material. The sensing zones of adjacent sensing means (3) trace out scanning paths which periodically overlap in a sampling region. One of the sensing means (primary) scans over a known reference to update its calibration periodically or continuously and this is transferred to the other sensing means (secondary) effectively via the travelling material (due to the overlap). Calibration is performed by signal processing means, storing and comparing monitoring signal levels or corresponding digital values derived at positions of overlap and making computations for the purpose of calibration. With sufficient overlap of the scanning paths any one of the sensors can be made redundant. Alternatives include sensing means which move relative to other sensing means as well as rotary arrangements.
Apparatus for sampling a material which travels past a sampling region, the apparatus comprising:
Apparatus for sampling a material which travels past a sampling region, the apparatus comprising:
A method of sampling material travelling past a sampling region across which a plurality of sensing means are arranged at spaced intervals, the sensing means having respective sensing zones in the sampling region, the method including the steps of causing relative periodic movement between the sensing means and the sampling region, or between at least one of the sensing means and the remaining sensing means so that, in a cycle of movement, there is a periodic overlap of at least the sensing zones of adjacent sensing means in the sampling region due to an overlap of respective scanning paths of the sensing means;
Dependencies are inferred from the claim text.