Wet film thickness gauge
AssigneeR. R. Donnelley & Sons Company
InventorRonald A. Banike
Life of this patent
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AssigneeR. R. Donnelley & Sons Company
InventorRonald A. Banike
Estimating the term…
In order to achieve relative simplicity in a reliable measurement technique, an apparatus and method for measuring wet film thickness on a surface is disclosed. The apparatus includes a fixture adapted to be positioned in close proximity to the surface, a gauge supported by the fixture for movement toward and away from the surface, and a spacer for spacing the fixture at a selected distance from the surface. The gauge is moveable from a first position out of contact with the wet film to a second position in contact with the surface to create a measurable spot of the wet film on the gauge. The method includes providing a gauge supported for movement toward and away from the surface, moving the gauge into contact with the surface to create a measurable wet film spot, and moving the gauge out of contact with the wet film to measure the spot. When this has been achieved, the method includes the further step of taking a measurement of the wet film spot and converting the measurement to a wet film thickness, preferably by utilizing a calibration graph that has been created by utilizing a test plate having a tapered channel of known depth.
An apparatus for measuring wet film thickness on a surface, comprising:
An apparatus for measuring wet film thickness on a surface, comprising:
An apparatus for measuring wet film thickness on a surface, comprising:
A method of measuring wet film thickness on a surface, comprising the steps of:
Dependencies are inferred from the claim text.