Glitchless test signal generator
AssigneeMicro Control Company
InventorPhilip A. Bailey
Life of this patent
Estimating the term…
Abstract
A test signal generating system for providing test signals to electronic circuit components under test in a burn-in system, the test signal generating system having a timing arrangement for eliminating glitches from the test signals, The test signal generating system comprises a data generator, a timing generator and a format selector, each of which provides an input signal to a test signal selector, A first, second and third flip-flop are electrically connected to the data generator, timing generator and format selector, respectively. A fourth flip-flop is electrically connected to an output of the test signal selection means, Each of the flip-flops is triggered by the same clock.
Claims6
A test signal generating system for generating glitchless test signals to be provided to an electronic circuit component under test in a burn-in system, the test signal generating system comprising:
- a data generator providing a data signal;
- a timing generator providing a cycle clock signal;
- a format selector providing a format signal;
- a trigger clock providing a trigger clock signal formed of pulses and having trigger clock period;
- first storage means, connected to the data generator, the timing generator, the format selector and the trigger clock, for storing as stored signals the present states of the data signal, the cycle clock signal and the format signal upon receipt of one of the pulses in the trigger clock signal;
- test signal selection means, coupled to the first storage means, for receiving the stored signals and providing a test signal based on the stored signals;
- second storage means, coupled to the test signal selection means and the trigger clock, for storing as a stored test signal a present state of the test signal upon receipt of a pulse in the trigger clock signal;
- and
- wherein the second storage means provides the stored test signal until a subsequent pulse in the trigger clock signal such that glitches in the test signal caused by skew in timing of providing the stored signals to the test signal selection means are not passed to the electronic circuit component under test.
Dependencies are inferred from the claim text.