Process for fabricating a substrate with thin film capacitor
AssigneeFujitsu Limited
InventorsMichael G. Peters, William T. Chou, Wen-chou V. Wang, Michael G. Lee, Solomon I. Beilin
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AssigneeFujitsu Limited
InventorsMichael G. Peters, William T. Chou, Wen-chou V. Wang, Michael G. Lee, Solomon I. Beilin
Estimating the term…
A thin-film bypass capacitor is fabricated by forming a plurality of through holes through the thickness of a nonconductive base substrate and filling the through holes with a conductive material to form ground vias and power vias. A sequence of back side metalization layers are applied to the back side surface of the base substrate. A sequence of bottom contact layers are applied to the front side surface of the base substrate. A bottom contact power terminal is formed and a bottom contact metalization layer is applied to the surface of the bottom contact layers. A portion of the metalization layer is removed and an insulating layer is formed on the surface of the bottom contact metalization layer. A ground metalization feedthrough and a power metalization feedthrough are formed at the surface of the insulating layer. A sequence of top contact layers are applied to the surface of the insulating layer and a front side ground terminal and front side power terminal are formed. A back side ground terminal and a back side power terminal are formed at the back side of the base substrate.
A method for forming a thin-film capacitor comprising the steps of:
A method for fabricating a thin-film capacitor comprising the steps of:
A method for fabricating a thin-film bypass capacitor comprising the steps of:
Dependencies are inferred from the claim text.