Method for manufacturing a capacitor having a rough electrode surface
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorYoshio Hayashide
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Abstract
A silicon layer having semispherical protrusions of about 100 nm is formed as a lower electrode of a capacitor by low pressure vapor deposition method. A silicon oxide film is formed by oxidizing the surface of this silicon layer. The intervals between the rough portions of the silicon layer are increased by removing this silicon oxide film. Thereafter, a dielectric layer and an upper electrode are formed. In other methods, after the formation of the silicon layer having the roughness, thermal treatment is continuously carried out in oxygen-free atmosphere to increase radius of curvature of the roughness of the silicon layer. Thereafter, the dielectric layer and the upper electrode are formed.
Claims6
A method of manufacturing a capacitor having a stacked structure of a first electrode layer, a dielectric layer, and a second electrode layer, on a semiconductor substrate, comprising the steps of:
- forming a silicon layer for said first electrode layer by chemical vapor deposition method in which a polycrystal silicon grain is included in an amorphous silicon layer, a surface of said silicon layer being formed with semispherical protrusions;
- thermally treating said formed silicon layer with the surface of said silicon layer being exposed by heating said formed silicon layer in a vacuum at a temperature between about 500.degree. C. and 650.degree. C. for about 10 minutes to 5 hours;
- forming a dielectric layer on the surface of said thermally treated silicon layer;
- and
- forming a second electrode layer on the surface of said dielectric layer.
A method of manufacturing a capacitor comprising a first electrode layer, a dielectric layer, and a second electrode layer, on a semiconductor substrate, comprising the steps of:
- forming a silicon layer for said first electrode layer by a chemical vapor deposition method in which a polycrystal silicon grain is included in an amorphous silicon layer, a surface of said silicon layer being formed with semispherical protrusions;
- oxidizing the surface of said silicon layer having the semispherical protrusions and forming a silicon oxide film on the surface of said silicon layer;
- removing at least said silicon oxide film, and exposing the surface of said silicon layer;
- heating said exposed silicon layer in a vacuum at a temperature between about 500.degree. C. and 650.degree. C. for about 10 minutes to 5 hours;
- forming the dielectric layer on the surface of said heated silicon layer;
- and
- forming the second electrode layer on the surface of said dielectric layer.
A method of manufacturing a capacitor comprising a first electrode layer, a dielectric layer, and a second electrode layer, on a semiconductor substrate, comprising the steps of:
- forming a silicon layer for said first electrode layer by a chemical vapor deposition method in which a polycrystal silicon grain is included in an amorphous silicon layer, a surface of said silicon layer being formed with semispherical protrusions;
- oxidizing the surface of said silicon layer having the semispherical protrusions and forming a silicon oxide film on the surface of said silicon layer;
- removing at least said silicon oxide film, and exposing the surface of said silicon layer;
- heating said exposed silicon layer in an inert gas atmosphere at a temperature between about 500.degree. C. to 650.degree. C. for about 10 minutes to 5 hours;
- forming the dielectric layer on the surface of said heated silicon layer;
- and
- forming the second electrode layer on the surface of said dielectric layer.
A method of manufacturing a capacitor having a stacked structure of a first electrode layer, a dielectric layer, and a second electrode layer, on a semiconductor substrate, comprising the steps of:
- forming a silicon layer for said first electrode layer by a chemical vapor deposition method in which a polycrystal silicon grain is included in an amorphous silicon layer, a surface of said silicon layer being formed with semispherical protrusions;
- thermally treating said formed silicon layer with the surface of said silicon layer being exposed by heating said formed silicon layer in an inert gas atmosphere at a temperature between about 500.degree. C. and 650.degree. C. for about 10 minutes to 5 hours;
- forming a dielectric layer on the surface of said thermally treated silicon layer;
- and
- forming a second electrode layer on the surface of said dielectric layer.
Dependencies are inferred from the claim text.