Dual-port type semiconductor integrated memory circuit
AssigneeFujitsu Limited
InventorKeizo Aoyama
Life of this patent
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AssigneeFujitsu Limited
InventorKeizo Aoyama
Estimating the term…
A dual-port memory circuit includes a memory cell having a pair of nodes, a first port having a first pair of bit lines and a first word line connected to said memory cell, and a second port having a second pair of bit lines and a second word line connected to said memory cell. A detection circuit detects that data is written from one of the first and second ports in a state where the memory cell is selected by both the first and second ports. A control circuit decreases a potential of one of the nodes in response to a detection output of the detection circuit.
A dual-port memory circuit comprising:
A dual-port memory circuit comprising:
A dual-port memory circuit comprising:
A dual-port memory circuit comprising:
A dual-port memory circuit comprising:
A dual-port memory circuit, comprising:
A dual-port memory circuit, comprising:
Dependencies are inferred from the claim text.
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No related US applications are recorded in the indexed filing history.
Arrangements for writing information into, or reading information out from, a digital store: bit line control circuits, e.g. drivers, boosters,…
Arrangements for selecting an address in a digital store: multiple access memory array, e.g. addressing one storage element via at least two…
Static stores
Term ended 24 Feb 2012 (estimated)
USPTO file history isn’t available for this patent, so only indexed dates are shown.
(1) Field of the Invention
The present invention generally relates to semiconductor integrated storage devices, and more particularly to a dual-port type semiconductor integrated memory circuit.
(2) Description of the Prior Art
Other objects, features and advantages of the present invention will become more apparent from the following detailed description when read in conjunction with the accompanying drawings, in which:
FIG. 1A is a block diagram of a system having a conventional dual-port memory;
FIG. 1B is a block diagram of the dual-port memory shown in FIG. 1A;
FIG. 3A shows an outline of a first embodiment of the present invention. In FIG. 3A, parts which are the same as those shown in the previous figures are given the same reference numerals. According to the first embodiment of the present invention, when the two ports of the dual-port memory select the same rows and data is written into a memory cell array (not shown) via one of the two ports, a select level of a row select line of the other port is decreased to a level between a normal select level and a non-select level at least during a time when the write operation is being carried out. An address match detection circuit 70 shown in FIG. 3A detects a case in which the same row is selected by both the left and right ports. A right-row-decoder power control circuit 71 functions to reduce the select level of the specified right-row select line, and a left-row-decoder power control circuit 72 functions to reduce the select level of the specified left-row select line.
A row address signal comprising address bits A.sub.0R -.sub.iR related to the right port is converted into a MOS-level signal by an address buffer 32. Similarly, a row address signal comprising of address bits A.sub.0L -A.sub.iL related to the left port is converted into a MOS-level signal by an address buffer 31. The MOS-level address signals from the address buffers 31 and 32 are input to the address match detection circuit 70, which determines whether or not the row addresses of the right and left ports match each other. When it is determined that the row addresses of the right and left ports match each other, the address match detection circuit 70 generates an address match detection signal AM, which is output to the right-row-decoder power control circuit 71 and the left-row-decoder power control circuit 72. The circuit 71 receives the address match, detection signal AM and a write control signal /WE.sub.L related to the left port, and outputs a power supply voltage V.sub.CR to a right-row decoder 22 in the right port. Similarly, the circuit 72 receives the address match detection signal AM and a write control signal /WE.sub.R related to the right port, and outputs a power supply voltage V.sub.CL to a left-row decoder 21. The left-row and right-row decoders 21 and 22 receive the output signals of the address buffers 31 and 32 and the power supply voltages V.sub.CL and V.sub.CR, respectively, and send output signals to the row select lines WL.sub.R and WL.sub.L, respectively.
FIG. 3C is a block diagram of the entire structure of the dual-port memory according to the first embodiment of the present invention. A block 100 shown in FIG. 3C comprises of the address match detection circuit 70, the right-row-decoder power control circuit 71 and the left-row-decoder power control circuit 72 shown in FIG. 3A.