Back to results
US 5,317,154 AGranted
Electron microscope equipped with x-ray analyzer
AssigneeJOEL Ltd.
InventorToshikazu Honda
Life of this patent
Estimating the term…
Abstract
An electron microscope equipped with an x-ray detector whose position is made different, depending on whether the detector is in use or not. The microscope prevents the irradiated position and the image from escaping even when the detector is moved into or out of a valve. A switch is operated to move the detector. The microscope has a deflection current-correcting circuit which supplies correcting currents to the deflection coils in step with the operation of the switch.
Claims5
An electron microscope comprising:
- an electron gun for producing an electron beam;
- a specimen to which said electron beam is irradiated;
- an x-ray detector for detecting the x-rays emanating from said specimen, wherein said x-ray detector being moved between a first position remote from said specimen and a second position close to said specimen and an error of an irradiated position on said specimen caused by moving said X-ray detector at said second position;
- a deflection means for deflecting said electron beam irradiated to said specimen;
- a correcting signal generating means for generating a correcting signal, wherein said correcting signal is so set that the error of the position on said specimen irradiated by said electron beam caused by moving said X-ray detector to the second position is compensated;
- and
- a switching means for supplying said correcting signal to said deflecting means.
4 more elements
An electron microscope comprising:
- an electron gun for producing an electron beam;
- an objective lens having an upper polepiece and a bottom polepiece;
- a specimen to which said electron beam is irradiated, said specimen being placed between said upper polepiece and said bottom polepiece;
- an x-ray detector for detecting the x-rays emanating from said specimen;
- a fluorescent screen for detecting an image transmitted through said specimen;
- a driving means for moving said x-ray detector between a first position remote from said specimen and a second position close to said specimen and an error of an irradiated position on said specimen and an error of an image position on said fluorescent screen are caused by moving said X-ray detector at said position;
- a first deflection means for deflecting said electron beam irradiated to said specimen, said first deflection means being positioned above said specimen;
- a first correcting signal generating means for generating a first correcting signal, wherein said first correcting signal is so set that the error of the position on said specimen irradiated by said electron beam caused by moving said X-ray detector to the second position is compensated;
- a first switching means for supplying said first correcting signal to said first deflecting means;
- a second deflection means for deflecting electron beam transmitted through said specimen, said second deflection means being positioned below said objective lens;
- a second correcting signal generating means for generating a second correcting signal, wherein said second correcting signal is so set that the error of the image projected on said fluorescent screen caused by moving said detector to the second position is compensated;
- and
- a second switching means for supplying said second correcting signal to said second deflecting means.
10 more elements
Dependencies are inferred from the claim text.