Dual ion injector for tandem accelerators
AssigneeHigh Voltage Engineering Europa B.V.
InventorDirk J. W. Mous
Life of this patent
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Abstract
A compact ion beam injection apparatus for tandem accelerators wherein the outputs from two independent ion sources, that may be operated continuously, can be selectively chosen and mass analyzed so that the output from any one of the sources can be rapidly selected and efficiently directed to the input point of a tandem accelerator.
Claims13
An ion generation system adapted to direct ions from any one of a plurality of ion sources through a single defining aperture, comprising in combination:
- at least two ion sources each having an independent ion extraction electrode and independent power sources;
- a single uniform field magnetic analyzer having an independent ion-entrance location for ions from said sources respectively and common ion-exit location;
- and means for directing ions from each source through said analyzer and thence through said single defining aperture, said analyzer having a magnetic field which is varied in an appropriate manner to deflect in the same direction ions from any one of said ion sources and through the angle necessary for passage of the said ions through said single defining aperture, said magnetic analyzer having a non-normal field boundary at said ion-exit location and a unique non-normal boundary at each of said ion-entrance locations, whereby focussing is achieved for the ions from each of said source.
An ion generation system adapted to direct ions from any one of a plurality of ion sources through a single defining aperture, comprising in combination:
- at least two ion sources each having an independent ion extraction electrode and independent power sources;
- a single uniform field magnetic analyzer having an independent ion-entrance location for ions from said sources respectively and common ion-exit location;
- and means for directing ions from each source through said analyzer and thence through said single defining aperture, said analyzer having a magnetic field which is varied in an appropriate manner to deflect in the same direction ions from any one of said ion sources and through the angle necessary for passage of the said ions through said single defining aperture, said magnetic analyzer having a non-normal field boundary at said ion-exit location and a single non-normal planar boundary for both of said ion-entrance locations, whereby focussing is achieved for the ions from each of said source.
Dependencies are inferred from the claim text.