Position measurement of moving atoms using optical fields
AssigneeDuke University
InventorJohn E. Thomas
Life of this patent
Estimating the term…
Loading patent…
AssigneeDuke University
InventorJohn E. Thomas
Estimating the term…
Disclosed is a method and apparatus for precisely measuring the position of moving atoms in an atom beam. The method employs atomic resonance imaging in which a spatially varying potential correlates an atomic resonance frequency with the atomic position. The method comprises (a) emptying an atomic beams of all atoms in a predetermined detectable final state; (b) passing the atomic beam through a field which induces atoms in the beam to make a transition from the initial atomic state to the detectable final atomic state, while simultaneously providing a spatially varying potential and wherein the energy of the final atomic state of the atoms is dependent upon the position of the atoms in the spatially varying potential concurrent with the field; and (c) detecting the final atomic state of said atoms to generate a spectrum which corresponds to the position distribution of atoms in the atomic beam. Apparatus for implementing said method of measuring moving atoms is also disclosed.
A method of measuring the position of atoms in an atomic beam, comprising:
An apparatus for measuring the position of atoms in an atomic beam, comprising:
Dependencies are inferred from the claim text.