Semiconductor substrate surface processing method using combustion flame
AssigneeKabushiki Kaisha Toshiba
InventorsTohru Watanabe, Katsuya Okumura
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AssigneeKabushiki Kaisha Toshiba
InventorsTohru Watanabe, Katsuya Okumura
Estimating the term…
In order to provide the processing required to prevent a semiconductor substrate from becoming contaminated or damaged, without heating it in a kiln, a combustion flame of a gas that is a mixture of hydrogen and oxygen is applied to the surface of the semiconductor substrate, so that only the substrate surface is heated. Oxidizing or reducing processing can be provided by varying the ratio of hydrogen to oxygen. A device that enables this processing method comprises a first conduit (6) for guiding hydrogen; a second conduit (7) for guiding oxygen; a flame generation means (5) for combusting the hydrogen and the oxygen in a mixed state to generate a downward-pointing flame over a range wider than the diameter of a semiconductor substrate (1) that is being processed; a flow regulation means (8) and (9) provided midway in each of the first tube and the second tube, for regulating the fluid passing through each of the first tube and the second tube; and a conveyor means (2), (3), and (14) for conveying the semiconductor substrate that is being processed, provided below the flame generation means.
A semiconductor substrate surface processing method characterized in that a combustion flame formed of a gas that is a mixture of hydrogen and oxygen is applied to a semiconductor substrate surface, and that only said substrate surface is heated thereby.
Dependencies are inferred from the claim text.