X-ray imaging particularly adapted for low Z materials
AssigneeAmerican Science and Engineering, Inc.
InventorsMartin Annis, Paul J. Bjorkholm
Life of this patent
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AssigneeAmerican Science and Engineering, Inc.
InventorsMartin Annis, Paul J. Bjorkholm
Estimating the term…
An imaging device for increasing the ability to recognize, in x-ray produced images, materials of low atomic number. A flying spot scanner illuminates an object to be imaged in a raster pattern; the flying spot repeatedly sweeps a line in space, and the object to be imaged is moved so that the illuminating beam intersects the object. At least a pair of x-ray detectors are employed, each pair associated with signal processing apparatus and a display. The two detectors employed (and the associated electrons and display) are selected from a set of three which includes a transmitted detector located at the line in space which is repeatedly traversed by the pencil beam, a forward scatter detector which is located further from the x-ray beam than the object to respond to photons scattered by the object being illuminated out of the path of the beam, and a back scatter detector which is located closer to the x-ray source than the object being imaged and also arranged to detect photons scattered out of the beam path by the object. In another embodiment of the invention all three detectors and their associated electronics/displays are employed.
An imaging system for inspecting an object to detect the presence and shape of high Z and low Z material components of said object to facilitate simultaneous detection of high z components such as metal weapons and low z components such as narcotics, explosives and plastic weapons, said system comprising:
An imaging system for inspecting an object to detect the presence and shape of high Z and low Z material components of said object to facilitate simultaneous detection of high z components such as metal weapons and low z components such as narcotics, explosives and plastic weapons, said system comprising:
A method of inspecting an object to detect the presence and shape of high Z and low Z material components of said object to facilitate simultaneous detection of high z components such as metal weapons and low z components such as narcotics, explosives and plastic weapons, said method comprising:
A method of inspecting an object to detect the presence and shape of high Z and low Z material components of said object to facilitate simultaneous detection of high z components such as metal weapons and low z components such as narcotics, explosives and plastic weapons, said method comprising:
An imaging system for inspecting an object to detect the presence and shape of high Z and low Z material components of said object to facilitate simultaneous detection of high z components such as metal weapons and low z components such as narcotics, explosives and plastic weapons, said system comprising:
An imaging system for inspecting an object to detect the presence and shape of high Z an low Z material components of said object to facilitate simultaneous detection of high z components such as metal weapons and low z components such as narcotics, explosives and plastic weapons, said system comprising:
A method of inspecting an object to detect the presence and shape of high Z and low Z material components of said object to facilitate simultaneous detection of high z components such as metal weapons and low z components such as narcotics, explosives and plastic weapons, said method comprising:
A method of inspecting an object to detect the presence and shape of high Z and low Z material components of said object to facilitate simultaneous detection of high z components such as metal weapons and low z components such as narcotics, explosives and plastic weapons, said method comprising:
Dependencies are inferred from the claim text.