Automatic focusing and astigmatism correction for electron beam apparatus
AssigneeJEOL Ltd.
InventorAtsushi Yamada
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AssigneeJEOL Ltd.
InventorAtsushi Yamada
Estimating the term…
A method of automatically and accurately accomplishing focusing and astigmatism correction in an electron beam apparatus such as a scanning electron microscope. The electron beam is raster scanned to scan a specimen in two dimensions. If the obtained signal intensity distribution curve has only one peak, the peak position P2 of a curve obtained by raster scanning the beam vertically is detected. The peak position P1 of a curve obtained by raster scanning the beam horizontally is detected. An intermediate position P0 is calculated, using the formula P0=(P1+P2)/2 The intensity of excitation of the objective lens is adjusted to this intermediate position P0. In this way, if two peaks cannot be obtained by a horizontal raster scan of the beam, depending on the state of the surface of the specimen, it is possible to accurately bring the beam into focus at the position of the circle of least confusion. After this focusing operation, an automatic astigmatism correction is made.
A method of automatically accomplishing focusing and astigmatism correction in an electron beam apparatus having an objective lens, a condenser leans for sharply focusing an electron beam directed to a surface of a specimen, deflecting means for scanning the electron beam in two dimensions in the x- and y-directions, and an astigmatism corrector disposed in the electron beam path, said method comprising the steps of:
Dependencies are inferred from the claim text.