Particulate trap for vertical furnace
AssigneeInternational Business Machines Corporation
InventorsJames P. Brannen, Richard R. Hansotte, Jr., Dieter K. Neff
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AssigneeInternational Business Machines Corporation
InventorsJames P. Brannen, Richard R. Hansotte, Jr., Dieter K. Neff
Estimating the term…
A contaminant trap for a high temperature, vertical furnace of the type used in semiconductor fabrication processing. The trap is designed to reduce particulate deposition within the process chamber, thereby decreasing the likelihood of by-product contamination of the wafers. The trap includes a housing having at least one sidewall, a bottom wall and a top wall which together define an inner compartment. The housing is attached to the exhaust port of the process chamber such that exhaust by-products in the process chamber may not be evacuated through the exhaust port around the housing. The housing has an input opening in the sidewall through which exhaust by-products pass from the process chamber into the inner compartment. An output opening extends through the sidewall near the top wall through which exhaust by-products are subsequently removed from the interior compartment of the housing. When the housing is attached to the exhaust port, the bottom wall of the housing collects particulate resulting from deposition of exhaust by-products within the interior compartment of the housing, thereby preventing the collected particulate from becoming contaminant within the process chamber.
A contaminant trap for a vertical furnace having a process chamber with an exhaust port near an upper end of the chamber through which exhaust by-products from the process chamber may be evacuated, said contaminant trap comprising:
A contaminant trap for a vertical furnace having a process chamber with an exhaust port near an upper end of the chamber through which exhaust by-products from the process chamber may be evacuated, said contaminant trap comprising:
A contaminant trap for a vertical furnace having a process chamber With an exhaust port near an upper end of the chamber through which exhaust by-products from the process chamber may be evacuated, said contaminant trap comprising:
Apparatus for processing semiconductor wafers, said apparatus comprising:
Dependencies are inferred from the claim text.