Integrated optical apparatus for the interferometric measurement of light waves
AssigneeLITEF GmbH
InventorMartin Wendler
Life of this patent
Estimating the term…
Abstract
Apparatus for measurement of light waves with an unbalanced optical interferometer. The apparatus consists of waveguides on a flat substrate material characterized by direction-dependent thermal expansion. Thermal compensation is achieved without active regulation by a predetermined spatial arrangement and length ratio of the light paths so that the optical lengths of the two waveguides change by precisely the same amount. As a result, the optical path difference is independent of temperature changes.
Claims9
An interferometer with temperature invariant optical path length difference formed in integrated optics on an anisotropic substrate comprising, in combination:
- a) a pair of monomode waveguides for receiving an input light beam, said waveguides being of differing optical path lengths;
- b) the directions of said waveguides being selected with respect to the crystal axes of said substrate, their path lengths and the direction of polarization of said input light beam so that the optical length difference is unaffected by temperature changes;
- and
- c) the geometric positions of said light paths and their lengths are chosen with regard to the anisotropic material effect of different coefficients of thermal expansion in different spatial directions of said substrate.
An interferometer with temperature invariant optical path length difference formed in integrated optics on an anisotropic substrate comprising, in combination:
- a) a pair of monomode waveguides for receiving an input light beam, said waveguides being of differing optical path lengths;
- b) the directions of said waveguides being selected with respect to the crystal axes of said substrate, their path lengths and the direction of polarization of said input light beam so that the optical length difference is unaffected by temperature changes;
- and
- c) the geometric positions of said light paths and their lengths are chosen with regard to the anisotropic material effect of different thermal changes of refractive indices in different spatial directions of said substrate.
An interferometer with temperature invariant optical path length difference formed in integrated optics on an anisotropic substrate comprising, in combination:
- a) a pair of monomode waveguides for receiving an input light beam, said waveguides being of differing optical path lengths;
- b) the directions of said waveguides being selected with respect to the crystal axes of said substrate, their path lengths and the direction of polarization of said input light beam so that the optical length difference is unaffected by temperature changes;
- and
- c) the geometric positions of said light paths and their lengths are chosen with regard to the anisotropic material effect of different coefficients of thermal expansion in different spatial directions of the substrate and the anisotropic material effect of differing thermal changes of refractive indices in different spatial directions of said substrate.
An interferometer as defined in claim comprising a Michelson interferometer.
An interferometer as defined in claim comprising a Mach-Zehnder interferometer.
Dependencies are inferred from the claim text.