A method for testing the electrical circuit tracings on a printed circuit board comprising the steps of:
- (a) affixing the printed circuit board to the top plate of a test fixture device comprising:
- (1) a top plate and a bottom plate disposed in parallel with one other, the plates being movable with respect to one another between a first plate position wherein the top plate is distal to the bottom plate and a second plate position wherein the top plate is proximate to the bottom plate, the top plate having an upper surface and a lower surface;
- (2) plate moving means for moving the plates between the first plate position and the second plate position;
- (3) means for urging the plates toward the first plate position;
- (4) means for affixing a printed circuit board to the upper surface of the top plate;
- (5) a plurality of apertures defined within the top plate and aligned with a loci of points along the circuit tracings on the printed circuit board;
- (6) a plurality of parallel test probes affixed to the bottom plate so as to be perpendicular to the bottom plate and so as to be positionally disposed between the bottom plate and the top plate when the plates are in the first plate position, each test probe being aligned with a corresponding aperture in the top plate, the plurality of test probes comprising a plurality of short probe members having a first probe height and a plurality of long probe members having a second probe height, each of the long probe members comprising an inner moiety telescopically disposed within an outer moiety, the height of the long probe members being telescopically alterable between the second probe height and the first probe height and the long probe members further each comprising means for urging the long probe member to the second probe height;
- (7) means for electrically connecting each of the test probes to electrical signal diagnostic equipment;
- (8) at least one slide bar slidably affixed to the upper surface of the top plate, the slide bar having at least one key hole shaped aperture, the key hole shaped aperture having a wide portion and a narrow portion;
- (9) at least one holding pin affixed to the bottom plate so as to be perpendicular to the bottom plate and so as to be positionally disposed between the bottom and top plates when the plates are in the first plate position, the holding pin comprising a shaft dimensioned to pass through both the narrow portion and the wide portion of the key hole shaped aperture in the slide plate and a head dimensioned to pass through the wide portion but not the narrow portion of the key hole shaped aperture;
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- (10) sliding means for sliding the slide bar between a first slide bar position wherein the wide portion of the key hole shaped aperture is aligned with the holding pin and a second slide bar position wherein the narrow portion of the key hole is aligned with the holding pin;
- wherein the top plate is perforated directly below the key hole shaped aperture in the slide bar to allow passage of the holding pin therethrough;
- (b) with the slide bar in the first slide bar position, activating the plate moving means to move the plates to the second plate position so that the holding pin protrude through the key hole shaped apertures in the slide bar and so that the short probe members come into contact with predetermined short probe locations on the circuit tracings and the long probe members come into contact with predetermined long probe locations on the circuit tracings;
- (c) conducting a circuitry integrity test by applying an electrical charge to the circuit tracings and comparing at least one measure circuitry integrity parameter at each short probe predetermined location to a corresponding standard value;
- (d) activating the sliding means to slide the slide bar to the second slide bar position;
- (e) deactivating the plate moving means so that the plates move toward the second plate position but are prevented from fully moving to the second plate position by the cooperation of the holding pin and the slide bar, whereby the short probe members lose contact with the circuit tracings but each of the long probe members maintains contact with its predetermined long probe location;
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- (f) conducting a circuitry function test by applying an electrical potential to the circuit tracing and comparing at least one measured circuitry function parameter at each of the predetermined long probe locations to a corresponding standard value.