Positioning device for an x-ray thickness measuring system
OwnerHelmut Fischerinventor
Life of this patent
Estimating the term…
Abstract
In x-ray fluorescence systems, the screening prevents the bringing of the measurement spot into the correct position in relation to the x-ray beam using the naked eye. The use of a television camera with a screen as well as illuminating devices makes the measuring system expensive and complicates the use of the system. According to the invention, this is avoided in that use is made of an illuminated device, which operates using an optical system and which reproduces, by convergent light beams at their intersection, the correct height position, lateral position and forward/rearward position of the measurement object when the tray carrying the measurement object has been moved to a forward position away from the x-ray beam.
Claims13
A measuring system having a device for positioning a measurement object relative to an x-ray beam for measuring the thickness of thin layers in accordance with the backscatter principle, comprising:
- an x-ray tube for emitting x-rays along a first geometric longitudinal axis,
- a proportional counter tube for receiving radiation backscatterred from said measurement object, and
- a carrier for supporting said measurement object and for bringing said measurement object into said geometric longitudinal axis, wherein
- a) said carrier is a tray, movable between a forward position for loading said measurement object and a rearward position at said first geometric longitudinal axis, and movable continuously up and down in said loading position at least in the 1/10 mm range,
- b) an illuminating device is supported in a fixed position by said measurement system above said tray, said illuminating device projecting focused light to a target spot that lies in front of said geometric longitudinal axis by a distance by which said tray can be moved to said forward position in a translational movement from said first geometric longitudinal axis, and
- c) said target spot has a height position that corresponds to the optimal height position of the spot at which said x-ray beam impinges said measurement object on said tray.
A measuring system having a device for positioning a measurement object relative to an x-ray beam for measuring the thickness of thin layers in accordance with the backscatter principle, comprising:
- an x-ray tube for emitting x-rays along a first geometric longitudinal axis,
- a proportional counter tube for receiving radiation backscatterred from said measurement object, and
- a carrier for supporting said measurement object and for bringing said measurement object into said geometric longitudinal axis, wherein
- a) said carrier is a tray, movable between a forward position for loading said measurement object and a rearward position at said first geometric longitudinal axis, and movable continuously up and down in said loading position at least in the 1/10 mm range,
- b) an illuminating device is supported in a fixed position by said measurement system above said tray, said illuminating device projecting focused light to a target spot that lies in front of said geometric longitudinal axis by a distance by which said tray can be moved to said forward position in a translational movement from said first geometric longitudinal axis,
- c) said target spot has a height position that corresponds to the optimal height position of the spot at which said x-ray beam impinges said measurement object on said tray, and
- d) said illuminating device comprises a bend-resistant unit having a light generator device that emits two light beams that intersect one another under an angle bisector along a second geometric longitudinal axis for said target spot and a mask through which each of said light beams passes;
- each of said masks has a marking, which markings enclose between them said target spot at the height of said target spot and are sharply imaged at the height of said target spot.
Dependencies are inferred from the claim text.