Surface undulation inspection apparatus
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsMitsuhito Kamei, Mikio Tachibana
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AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsMitsuhito Kamei, Mikio Tachibana
Estimating the term…
A surface undulation inspection apparatus for detecting a defect of a fine undulation including a change of a gentle profile or the like on a suitable surface of a specimen to be inspected, wherein a patterning light source is opposed to an image pickup lens having a pin hole with a specimen interposed therebetween to pin-hole image pickup the patterning light source through the specimen to be inspected whereby a ray passing through the specimen to be inspected is specified as a principal ray, and a local surface undulation defect on the surface of the specimen is stressed and a defective part is specified. Further, a display pattern generated by a pattern generator is displayed on a pattern display element to used it as a patterning light source, the pattern generator is feedback controlled by a deviation calculation circuit, a standard data generator circuit, a pattern width coincidence decision circuit and a comparison data circuit, or a coordinate conversion circuit and an angle detector circuit, and an intensity of the display pattern is regularly changed in an analog manner to detect an abnormality on the basis of a differential from the image data.
A surface undulation inspection apparatus in which a patterning light source and a camera are arranged on opposite sides with respect to a specimen to be inspected, said camera selectively focussing only a principal ray adjusted in focal point to said patterning light source through said specimen to be inspected, said apparatus comprising:
Dependencies are inferred from the claim text.